Quantitative strain determination in nanoparticles using aberration-corrected HREM. Johnson, C. L., Snoeck, E., Ezcurdia, M., Rodríguez-González, B., Pastoriza-Santos, I., Liz-Marzán, L. M., & Hÿtch, M. J. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany, pages 221–222, 2008. Springer, Berlin, Heidelberg.
bibtex   
@inproceedings{johnson_quantitative_2008,
	title = {Quantitative strain determination in nanoparticles using aberration-corrected {HREM}},
	booktitle = {{EMC} 2008 14th {European} {Microscopy} {Congress} 1–5 {September} 2008, {Aachen}, {Germany}},
	publisher = {Springer, Berlin, Heidelberg},
	author = {Johnson, C. L. and Snoeck, E. and Ezcurdia, M. and Rodríguez-González, B. and Pastoriza-Santos, I. and Liz-Marzán, L. M. and Hÿtch, M. J.},
	year = {2008},
	pages = {221--222},
}

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