Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System. Joo, Y., Han, C., & Park, K. IEICE Transactions (IEICET), 93-C(6):922-928, 2010.
Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System [link]Paper  bibtex   
@article{ dblp2976458,
  title = {Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System},
  author = {Young-Bok Joo and Chan-Ho Han and Kil-Houm Park},
  author_short = {Joo, Y. and Han, C. and Park, K.},
  bibtype = {article},
  type = {article},
  year = {2010},
  key = {dblp2976458},
  id = {dblp2976458},
  biburl = {http://www.dblp.org/rec/bibtex/journals/ieicet/JooHP10},
  url = {http://search.ieice.org/bin/summary.php?id=e93-c_6_922},
  journal = {IEICE Transactions (IEICET)},
  pages = {922-928},
  number = {6},
  volume = {93-C},
  text = {IEICE Transactions (IEICET) 93-C(6):922-928 (2010)}
}
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