A compact local binary pattern using maximization of mutual information for face analysis. Jun, B., Kim, T., & Kim, D. Pattern Recognit., 44(3):532–543, 2011.
A compact local binary pattern using maximization of mutual information for face analysis [link]Paper  doi  bibtex   
@article{DBLP:journals/pr/JunKK11,
  author    = {Bongjin Jun and
               Taewan Kim and
               Daijin Kim},
  title     = {A compact local binary pattern using maximization of mutual information
               for face analysis},
  journal   = {Pattern Recognit.},
  volume    = {44},
  number    = {3},
  pages     = {532--543},
  year      = {2011},
  url       = {https://doi.org/10.1016/j.patcog.2010.10.008},
  doi       = {10.1016/j.patcog.2010.10.008},
  timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/pr/JunKK11.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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