An LSSD Compliant Scan Cell for Flip-Flops. Juracy, L. R., Moreira, M. T., Kuentzer, F. A., Moraes, F. G., & Amory, A. M. In IEEE International Symposium on Circuits and Systems (ISCAS), pages 1–4, 2018. doi bibtex @inproceedings{Juracy18,
author = {Leonardo Rezende Juracy and Matheus Trevisan Moreira and Felipe A. Kuentzer and F. G. Moraes and Alexandre M. Amory },
title = {An LSSD Compliant Scan Cell for Flip-Flops},
booktitle = {IEEE International Symposium on Circuits and Systems (ISCAS)},
pages = {1--4},
doi={10.1109/ISCAS.2018.8351515},
year = {2018},
keywords = {async, testing}
}
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