An LSSD Compliant Scan Cell for Flip-Flops. Juracy, L. R., Moreira, M. T., Kuentzer, F. A., Moraes, F. G., & Amory, A. M. In IEEE International Symposium on Circuits and Systems (ISCAS), pages 1–4, 2018.
doi  bibtex   
@inproceedings{Juracy18,
  author    = {Leonardo Rezende Juracy and Matheus Trevisan Moreira and Felipe A. Kuentzer and F. G. Moraes and Alexandre M. Amory },
  title     = {An LSSD Compliant Scan Cell for Flip-Flops},
  booktitle = {IEEE International Symposium on Circuits and Systems (ISCAS)},
  pages     = {1--4},
  doi={10.1109/ISCAS.2018.8351515}, 
  year      = {2018},
  keywords  = {async, testing}
}

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