An LSSD Compliant Scan Cell for Flip-Flops. Juracy, L. R., Moreira, M. T., Kuentzer, F. A., Moraes, F. G., & Amory, A. M. In IEEE International Symposium on Circuits and Systems, ISCAS 2018, 27-30 May 2018, Florence, Italy, pages 1–5, 2018. IEEE.
An LSSD Compliant Scan Cell for Flip-Flops [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/iscas/JuracyMKMA18,
  author    = {Leonardo Rezende Juracy and
               Matheus T. Moreira and
               Felipe A. Kuentzer and
               Fernando Gehm Moraes and
               Alexandre M. Amory},
  title     = {An {LSSD} Compliant Scan Cell for Flip-Flops},
  booktitle = {{IEEE} International Symposium on Circuits and Systems, {ISCAS} 2018,
               27-30 May 2018, Florence, Italy},
  pages     = {1--5},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {https://doi.org/10.1109/ISCAS.2018.8351515},
  doi       = {10.1109/ISCAS.2018.8351515},
  timestamp = {Wed, 25 Sep 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/iscas/JuracyMKMA18.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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