Using a Fault Hierarchy to Improve the Efficiency of DNF Logic Mutation Testing. Kaminski, G. K. & Ammann, P. In ICST, pages 386-395, 2009. IEEE Computer Society.
Using a Fault Hierarchy to Improve the Efficiency of DNF Logic Mutation Testing. [link]Link  Using a Fault Hierarchy to Improve the Efficiency of DNF Logic Mutation Testing. [link]Paper  bibtex   
@inproceedings{conf/icst/KaminskiA09a,
  added-at = {2014-08-05T00:00:00.000+0200},
  author = {Kaminski, Garrett Kent and Ammann, Paul},
  biburl = {http://www.bibsonomy.org/bibtex/2975de4bc36b558ed96045465d1dfec69/dblp},
  booktitle = {ICST},
  crossref = {conf/icst/2009},
  ee = {http://doi.ieeecomputersociety.org/10.1109/ICST.2009.13},
  interhash = {97cd65da3179c952f995d65567e31912},
  intrahash = {975de4bc36b558ed96045465d1dfec69},
  isbn = {978-0-7695-3601-9},
  keywords = {dblp},
  pages = {386-395},
  publisher = {IEEE Computer Society},
  timestamp = {2015-06-19T17:49:03.000+0200},
  title = {Using a Fault Hierarchy to Improve the Efficiency of DNF Logic Mutation Testing.},
  url = {http://dblp.uni-trier.de/db/conf/icst/icst2009.html#KaminskiA09a},
  year = 2009
}

Downloads: 0