Using Logic Criterion Feasibility to Reduce Test Set Size While Guaranteeing Double Fault Detection. Kaminski, G. K. & Ammann, P. In ICST Workshops, pages 167-176, 2009. IEEE Computer Society.
Using Logic Criterion Feasibility to Reduce Test Set Size While Guaranteeing Double Fault Detection. [link]Link  Using Logic Criterion Feasibility to Reduce Test Set Size While Guaranteeing Double Fault Detection. [link]Paper  bibtex   
@inproceedings{conf/icst/KaminskiA09b,
  added-at = {2014-08-05T00:00:00.000+0200},
  author = {Kaminski, Garrett Kent and Ammann, Paul},
  biburl = {http://www.bibsonomy.org/bibtex/21839f462dfca845350a4c29be71c58e8/dblp},
  booktitle = {ICST Workshops},
  crossref = {conf/icst/2009w},
  ee = {http://doi.ieeecomputersociety.org/10.1109/ICSTW.2009.13},
  interhash = {cbf23dea5f175bc4ea345ed750d35aae},
  intrahash = {1839f462dfca845350a4c29be71c58e8},
  isbn = {978-0-7695-3671-2},
  keywords = {dblp},
  pages = {167-176},
  publisher = {IEEE Computer Society},
  timestamp = {2015-06-19T17:49:03.000+0200},
  title = {Using Logic Criterion Feasibility to Reduce Test Set Size While Guaranteeing Double Fault Detection.},
  url = {http://dblp.uni-trier.de/db/conf/icst/icstw2009.html#KaminskiA09b},
  year = 2009
}

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