An exploration of combinatorial testing-based approaches to fault localization for explainable AI

An exploration of combinatorial testing-based approaches to fault localization for explainable AI. Kampel, L., Simos, D. E., Kuhn, D. R., & Kacker, R. N. Ann. Math. Artif. Intell., 90(7-9):951–964, 2022.

Paper doi bibtex

@article{DBLP:journals/amai/KampelSKK22,
  author       = {Ludwig Kampel and
                  Dimitris E. Simos and
                  D. Richard Kuhn and
                  Raghu N. Kacker},
  title        = {An exploration of combinatorial testing-based approaches to fault
                  localization for explainable {AI}},
  journal      = {Ann. Math. Artif. Intell.},
  volume       = {90},
  number       = {7-9},
  pages        = {951--964},
  year         = {2022},
  url          = {https://doi.org/10.1007/s10472-021-09772-0},
  doi          = {10.1007/s10472-021-09772-0},
  timestamp    = {Fri, 18 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/amai/KampelSKK22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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