An exploration of combinatorial testing-based approaches to fault localization for explainable AI. Kampel, L., Simos, D. E., Kuhn, D. R., & Kacker, R. N. Ann. Math. Artif. Intell., 90(7-9):951–964, 2022.
Paper doi bibtex @article{DBLP:journals/amai/KampelSKK22,
author = {Ludwig Kampel and
Dimitris E. Simos and
D. Richard Kuhn and
Raghu N. Kacker},
title = {An exploration of combinatorial testing-based approaches to fault
localization for explainable {AI}},
journal = {Ann. Math. Artif. Intell.},
volume = {90},
number = {7-9},
pages = {951--964},
year = {2022},
url = {https://doi.org/10.1007/s10472-021-09772-0},
doi = {10.1007/s10472-021-09772-0},
timestamp = {Fri, 18 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/amai/KampelSKK22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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