Profiler: integrated statistical analysis and visualization for data quality assessment. Kandel, S., Parikh, R., Paepcke, A., Hellerstein, J. M., & Heer, J. In International Working Conference on Advanced Visual Interfaces, AVI 2012, Capri Island, Naples, Italy, May 22-25, 2012, Proceedings, pages 547–554, 2012.
Paper doi bibtex @inproceedings{DBLP:conf/avi/KandelPPHH12,
author = {Sean Kandel and
Ravi Parikh and
Andreas Paepcke and
Joseph M. Hellerstein and
Jeffrey Heer},
title = {Profiler: integrated statistical analysis and visualization for data
quality assessment},
booktitle = {International Working Conference on Advanced Visual Interfaces, {AVI}
2012, Capri Island, Naples, Italy, May 22-25, 2012, Proceedings},
pages = {547--554},
year = {2012},
crossref = {DBLP:conf/avi/2012},
url = {https://doi.org/10.1145/2254556.2254659},
doi = {10.1145/2254556.2254659},
timestamp = {Sun, 02 Jun 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/avi/KandelPPHH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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