Profiler: integrated statistical analysis and visualization for data quality assessment. Kandel, S., Parikh, R., Paepcke, A., Hellerstein, J. M., & Heer, J. In International Working Conference on Advanced Visual Interfaces, AVI 2012, Capri Island, Naples, Italy, May 22-25, 2012, Proceedings, pages 547–554, 2012.
Profiler: integrated statistical analysis and visualization for data quality assessment [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/avi/KandelPPHH12,
  author       = {Sean Kandel and
                  Ravi Parikh and
                  Andreas Paepcke and
                  Joseph M. Hellerstein and
                  Jeffrey Heer},
  title        = {Profiler: integrated statistical analysis and visualization for data
                  quality assessment},
  booktitle    = {International Working Conference on Advanced Visual Interfaces, {AVI}
                  2012, Capri Island, Naples, Italy, May 22-25, 2012, Proceedings},
  pages        = {547--554},
  year         = {2012},
  crossref     = {DBLP:conf/avi/2012},
  url          = {https://doi.org/10.1145/2254556.2254659},
  doi          = {10.1145/2254556.2254659},
  timestamp    = {Sun, 02 Jun 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/avi/KandelPPHH12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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