Low-temperature synthesis of GaN film from aqueous solution by electrodeposition. Kang, J., Mitsuhashi, T., Kuroda, K., & Okido, M. Journal of Applied Electrochemistry, 49(9):871–881, September, 2019.
Paper doi abstract bibtex Gallium nitride (GaN) films were synthesized on n-type-Si (111) substrates using a low-cost and low-temperature technique of electrochemical deposition. The electrochemical behavior of Ga3+, NH4+, and NO3− ions in the aqueous solutions used as sources of GaN were confirmed by cyclic voltammetry. The scanning electron microscopy images showed that the films deposited at a current density of 3.5 mA cm−2 or greater have plate-like surface morphologies on the Si substrate. The energy-dispersive X-ray spectroscopy results showed that oxygen, gallium, and nitrogen coexist in these plate-like films. In the X-ray diffraction patterns, the sample synthesized at a current density of 3.5 mA cm−2 for 24 h exhibited peaks of gallium oxide and hexagonal-GaN phase. Photoluminescence analysis revealed a peak at 3.2 eV, which corresponds to the band gap energy of GaN, as well as a broad peak at around 2.5 eV at room temperature.
@article{kang_low-temperature_2019,
title = {Low-temperature synthesis of {GaN} film from aqueous solution by electrodeposition},
volume = {49},
issn = {0021-891X, 1572-8838},
url = {http://link.springer.com/10.1007/s10800-019-01327-w},
doi = {10.1007/s10800-019-01327-w},
abstract = {Gallium nitride (GaN) films were synthesized on n-type-Si (111) substrates using a low-cost and low-temperature technique of electrochemical deposition. The electrochemical behavior of Ga3+, NH4+, and NO3− ions in the aqueous solutions used as sources of GaN were confirmed by cyclic voltammetry. The scanning electron microscopy images showed that the films deposited at a current density of 3.5 mA cm−2 or greater have plate-like surface morphologies on the Si substrate. The energy-dispersive X-ray spectroscopy results showed that oxygen, gallium, and nitrogen coexist in these plate-like films. In the X-ray diffraction patterns, the sample synthesized at a current density of 3.5 mA cm−2 for 24 h exhibited peaks of gallium oxide and hexagonal-GaN phase. Photoluminescence analysis revealed a peak at 3.2 eV, which corresponds to the band gap energy of GaN, as well as a broad peak at around 2.5 eV at room temperature.},
language = {en},
number = {9},
urldate = {2022-06-22},
journal = {Journal of Applied Electrochemistry},
author = {Kang, Jaewook and Mitsuhashi, Takuaki and Kuroda, Kensuke and Okido, Masazumi},
month = sep,
year = {2019},
pages = {871--881},
}
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