@article{journals/tcad/KapurPSW96,
  added-at = {2020-09-24T00:00:00.000+0200},
  author = {Kapur, Rohit and Patil, Srinivas and Snethen, Thomas J. and Williams, Thomas W.},
  biburl = {https://www.bibsonomy.org/bibtex/220bd29eb0e2be397622742dd7a80ae23/dblp},
  ee = {https://doi.org/10.1109/43.511581},
  interhash = {e475644a92b5aaf1e02f70beb79a196d},
  intrahash = {20bd29eb0e2be397622742dd7a80ae23},
  journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.},
  keywords = {dblp},
  number = 8,
  pages = {1020-1025},
  timestamp = {2020-09-25T11:45:03.000+0200},
  title = {A weighted random pattern test generation system.},
  url = {http://dblp.uni-trier.de/db/journals/tcad/tcad15.html#KapurPSW96},
  volume = 15,
  year = 1996
}

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