Testing MEMS. Karam, J., Lubaszewski, M., Blanton, R. D. S., & Richardson, A. In VTS, pages 320-321, 1998. IEEE Computer Society.
Testing MEMS. [link]Link  Testing MEMS. [link]Paper  bibtex   
@inproceedings{conf/vts/KaramLBR98,
  added-at = {2023-03-24T00:00:00.000+0100},
  author = {Karam, Jean-Michel and Lubaszewski, Marcelo and Blanton, R. D. Shawn and Richardson, Andrew},
  biburl = {https://www.bibsonomy.org/bibtex/205d62fe7c920289aac4b064ae705d489/dblp},
  booktitle = {VTS},
  crossref = {conf/vts/1998},
  ee = {https://doi.ieeecomputersociety.org/10.1109/VTS.1998.10009},
  interhash = {429f916d27ecf4eb07256e8fe569e360},
  intrahash = {05d62fe7c920289aac4b064ae705d489},
  isbn = {0-8186-8436-4},
  keywords = {dblp},
  pages = {320-321},
  publisher = {IEEE Computer Society},
  timestamp = {2024-04-10T07:35:39.000+0200},
  title = {Testing MEMS.},
  url = {http://dblp.uni-trier.de/db/conf/vts/vts1998.html#KaramLBR98},
  year = 1998
}

Downloads: 0