A data mining approach to automate fault detection model development in the semiconductor manufacturing process. Kerdprasop, K. & Kerdprasop, N. Int. J. Mech, 5(4):336–344, 2011. bibtex @article{kerdprasop2011data,
title={A data mining approach to automate fault detection model development in the semiconductor manufacturing process},
author={Kerdprasop, Kittisak and Kerdprasop, Nittaya},
journal={Int. J. Mech},
volume={5},
number={4},
pages={336--344},
year={2011}
}
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