@inproceedings{kerdprasop2010feature,
  title={Feature selection and boosting techniques to improve fault detection accuracy in the semiconductor manufacturing process},
  author={Kerdprasop, Kittisak and Kerdprasop, Nittaya},
  booktitle={World Congress on Engineering 2012. July 4-6, 2012. London, UK.},
  volume={2188},
  pages={398--403},
  year={2010},
  organization={International Association of Engineers}
}

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