Feature selection and boosting techniques to improve fault detection accuracy in the semiconductor manufacturing process. Kerdprasop, K. & Kerdprasop, N. In World Congress on Engineering 2012. July 4-6, 2012. London, UK., volume 2188, pages 398–403, 2010. International Association of Engineers. bibtex @inproceedings{kerdprasop2010feature,
title={Feature selection and boosting techniques to improve fault detection accuracy in the semiconductor manufacturing process},
author={Kerdprasop, Kittisak and Kerdprasop, Nittaya},
booktitle={World Congress on Engineering 2012. July 4-6, 2012. London, UK.},
volume={2188},
pages={398--403},
year={2010},
organization={International Association of Engineers}
}