@article{journals/jssc/KertisHDPFSPGD09,
  added-at = {2020-08-30T00:00:00.000+0200},
  author = {Kertis, Robert A. and Humble, James S. and Daun-Lindberg, Mary A. and Philpott, Rick A. and Fritz, Karl E. and Schwab, Daniel J. and Prairie, Jason F. and Gilbert, Barry K. and Daniel, Erik S.},
  biburl = {https://www.bibsonomy.org/bibtex/2bce22de3616d0264a947db14d2370e4c/dblp},
  ee = {https://doi.org/10.1109/JSSC.2009.2022672},
  interhash = {1c69c25e821662a1ac3aeb76c9ea857d},
  intrahash = {bce22de3616d0264a947db14d2370e4c},
  journal = {IEEE J. Solid State Circuits},
  keywords = {dblp},
  number = 9,
  pages = {2295-2311},
  timestamp = {2020-08-31T11:41:17.000+0200},
  title = {A 20 GS/s 5-Bit SiGe BiCMOS Dual-Nyquist Flash ADC With Sampling Capability up to 35 GS/s Featuring Offset Corrected Exclusive-Or Comparators.},
  url = {http://dblp.uni-trier.de/db/journals/jssc/jssc44.html#KertisHDPFSPGD09},
  volume = 44,
  year = 2009
}

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