@inproceedings{DBLP:conf/date/KhajehGDKEKA09,
  author       = {Amin Khajeh and
                  Aseem Gupta and
                  Nikil D. Dutt and
                  Fadi J. Kurdahi and
                  Ahmed M. Eltawil and
                  Kamal S. Khouri and
                  Magdy S. Abadir},
  editor       = {Luca Benini and
                  Giovanni De Micheli and
                  Bashir M. Al{-}Hashimi and
                  Wolfgang M{\"{u}}ller},
  title        = {{TRAM:} {A} tool for Temperature and Reliability Aware Memory Design},
  booktitle    = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France,
                  April 20-24, 2009},
  pages        = {340--345},
  publisher    = {{IEEE}},
  year         = {2009},
  url          = {https://doi.org/10.1109/DATE.2009.5090685},
  doi          = {10.1109/DATE.2009.5090685},
  timestamp    = {Wed, 07 Dec 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/KhajehGDKEKA09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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