@article{ kia-98,
  author = {Kia, Seyed M. and Parameswaran, Sri},
  title = {Designs for self checking flip-flops},
  journal = {IEE Proceedings-Computers and Digital Techniques},
  year = {1998},
  volume = {145},
  pages = {81-8},
  number = {2},
  note = {Copyright 1998, IEE 5895725 1350-2387 self checking flip-flops totally
	self checking TSC edge triggered error propagating flip-flops D flip-flop
	T flip-flop},
  abstract = {The authors introduce two low-cost, modular, totally self checking
	(TSC), edge triggered and error propagating (code disjoint) flip-flops:
	one, a D flip-flop used in TSC and strongly fault secure (SFS) synchronous
	circuits with two-rail codes, the other a T flip-flop, used in a
	similar way as the D flip-flop but retaining the error as an indicator
	until the next presetting, to aid error propagation. Thus, the self
	checking T flip-flop can be used as an error indicator. The self
	checking D flip-flop is smaller than the duplicate D flip-flop circuitry
	by 30%. The self checking T flip-flop error indicator is 60% smaller
	than the pervious error indicator in the literature. These circuits,
	unlike previously reported circuits, can also detect stuck-at faults
	in the clock inputs. The authors have also presented TSC/error propagating
	applications for the above flip-flops: a counter and a shift register},
  keywords = {automatic testing flip-flops},
  pdf = {http://www.cse.unsw.edu.au/~sridevan/index_files/00674968.pdf}
}

{"_id":"NKvuuNciXy3uwowWs","authorIDs":[],"author_short":["Kia, S.<nbsp>M.","Parameswaran, S."],"bibbaseid":"kia-parameswaran-designsforselfcheckingflipflops-1998","bibdata":{"abstract":"The authors introduce two low-cost, modular, totally self checking (TSC), edge triggered and error propagating (code disjoint) flip-flops: one, a D flip-flop used in TSC and strongly fault secure (SFS) synchronous circuits with two-rail codes, the other a T flip-flop, used in a similar way as the D flip-flop but retaining the error as an indicator until the next presetting, to aid error propagation. Thus, the self checking T flip-flop can be used as an error indicator. The self checking D flip-flop is smaller than the duplicate D flip-flop circuitry by 30%. The self checking T flip-flop error indicator is 60% smaller than the pervious error indicator in the literature. These circuits, unlike previously reported circuits, can also detect stuck-at faults in the clock inputs. The authors have also presented TSC/error propagating applications for the above flip-flops: a counter and a shift register","author":["Kia, Seyed M.","Parameswaran, Sri"],"author_short":["Kia, S.<nbsp>M.","Parameswaran, S."],"bibtex":"@article{ kia-98,\n author = {Kia, Seyed M. and Parameswaran, Sri},\n title = {Designs for self checking flip-flops},\n journal = {IEE Proceedings-Computers and Digital Techniques},\n year = {1998},\n volume = {145},\n pages = {81-8},\n number = {2},\n note = {Copyright 1998, IEE 5895725 1350-2387 self checking flip-flops totally\r\n\tself checking TSC edge triggered error propagating flip-flops D flip-flop\r\n\tT flip-flop},\n abstract = {The authors introduce two low-cost, modular, totally self checking\r\n\t(TSC), edge triggered and error propagating (code disjoint) flip-flops:\r\n\tone, a D flip-flop used in TSC and strongly fault secure (SFS) synchronous\r\n\tcircuits with two-rail codes, the other a T flip-flop, used in a\r\n\tsimilar way as the D flip-flop but retaining the error as an indicator\r\n\tuntil the next presetting, to aid error propagation. Thus, the self\r\n\tchecking T flip-flop can be used as an error indicator. The self\r\n\tchecking D flip-flop is smaller than the duplicate D flip-flop circuitry\r\n\tby 30%. The self checking T flip-flop error indicator is 60% smaller\r\n\tthan the pervious error indicator in the literature. These circuits,\r\n\tunlike previously reported circuits, can also detect stuck-at faults\r\n\tin the clock inputs. The authors have also presented TSC/error propagating\r\n\tapplications for the above flip-flops: a counter and a shift register},\n keywords = {automatic testing flip-flops},\n pdf = {http://www.cse.unsw.edu.au/~sridevan/index_files/00674968.pdf}\n}","bibtype":"article","id":"kia-98","journal":"IEE Proceedings-Computers and Digital Techniques","key":"kia-98","keywords":"automatic testing flip-flops","note":"Copyright 1998, IEE 5895725 1350-2387 self checking flip-flops totally self checking TSC edge triggered error propagating flip-flops D flip-flop T flip-flop","number":"2","pages":"81-8","pdf":"http://www.cse.unsw.edu.au/~sridevan/index_files/00674968.pdf","title":"Designs for self checking flip-flops","type":"article","volume":"145","year":"1998","bibbaseid":"kia-parameswaran-designsforselfcheckingflipflops-1998","role":"author","urls":{},"keyword":["automatic testing flip-flops"],"downloads":0,"html":""},"bibtype":"article","biburl":"http://www.cse.unsw.edu.au/~sridevan/pubs/Document.bib","creationDate":"2014-12-11T20:17:25.488Z","downloads":0,"keywords":["automatic testing flip-flops"],"search_terms":["designs","self","checking","flip","flops","kia","parameswaran"],"title":"Designs for self checking flip-flops","year":1998,"dataSources":["qmNv3eFxXczLaRktj"]}