SoC Root Canal! Root Cause Analysis of Power Side-Channel Leakage in System-on-Chip Designs. Kiaei, P. & Schaumont, P. IACR Trans. Cryptogr. Hardw. Embed. Syst., 2022(4):751–773, 2022.
SoC Root Canal! Root Cause Analysis of Power Side-Channel Leakage in System-on-Chip Designs [link]Paper  doi  bibtex   
@article{DBLP:journals/tches/KiaeiS22,
	title        = {SoC Root Canal! Root Cause Analysis of Power Side-Channel Leakage in System-on-Chip Designs},
	author       = {Pantea Kiaei and Patrick Schaumont},
	year         = 2022,
	journal      = {{IACR} Trans. Cryptogr. Hardw. Embed. Syst.},
	volume       = 2022,
	number       = 4,
	pages        = {751--773},
	doi          = {10.46586/tches.v2022.i4.751-773},
	url          = {https://doi.org/10.46586/tches.v2022.i4.751-773},
	timestamp    = {Mon, 26 Jun 2023 01:00:00 +0200},
	biburl       = {https://dblp.org/rec/journals/tches/KiaeiS22.bib},
	bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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