SoC Root Canal! Root Cause Analysis of Power Side-Channel Leakage in System-on-Chip Designs. Kiaei, P. & Schaumont, P. IACR Trans. Cryptogr. Hardw. Embed. Syst., 2022(4):751–773, 2022.
SoC Root Canal! Root Cause Analysis of Power Side-Channel Leakage in System-on-Chip Designs [link]Paper  doi  bibtex   
@article{DBLP:journals/tches/KiaeiS22,
  author       = {Pantea Kiaei and
                  Patrick Schaumont},
  title        = {SoC Root Canal! Root Cause Analysis of Power Side-Channel Leakage
                  in System-on-Chip Designs},
  journal      = {{IACR} Trans. Cryptogr. Hardw. Embed. Syst.},
  volume       = {2022},
  number       = {4},
  pages        = {751--773},
  year         = {2022},
  url          = {https://doi.org/10.46586/tches.v2022.i4.751-773},
  doi          = {10.46586/TCHES.V2022.I4.751-773},
  timestamp    = {Mon, 28 Aug 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tches/KiaeiS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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