Gate-Level Side-Channel Leakage Assessment with Architecture Correlation Analysis. Kiaei, P., Yao, Y., Liu, Z., Fern, N., Breunesse, C., Woudenberg, J. V., Gillis, K., Dich, A., Grossmann, P., & Schaumont, P. CoRR, 2022.
Gate-Level Side-Channel Leakage Assessment with Architecture Correlation Analysis [link]Paper  doi  bibtex   
@article{DBLP:journals/corr/abs-2204-11972,
	title        = {Gate-Level Side-Channel Leakage Assessment with Architecture Correlation Analysis},
	author       = {Pantea Kiaei and Yuan Yao and Zhenyuan Liu and Nicole Fern and Cees{-}Bart Breunesse and Jasper Van Woudenberg and Kate Gillis and Alex Dich and Peter Grossmann and Patrick Schaumont},
	year         = 2022,
	journal      = {CoRR},
	volume       = {abs/2204.11972},
	doi          = {10.48550/arXiv.2204.11972},
	url          = {https://doi.org/10.48550/arXiv.2204.11972},
	eprinttype   = {arXiv},
	eprint       = {2204.11972},
	timestamp    = {Thu, 28 Apr 2022 01:00:00 +0200},
	biburl       = {https://dblp.org/rec/journals/corr/abs-2204-11972.bib},
	bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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