Gate-Level Side-Channel Leakage Assessment with Architecture Correlation Analysis. Kiaei, P., Yao, Y., Liu, Z., Fern, N., Breunesse, C., Woudenberg, J. V., Gillis, K., Dich, A., Grossmann, P., & Schaumont, P. CoRR, 2022. Paper doi bibtex @article{DBLP:journals/corr/abs-2204-11972,
title = {Gate-Level Side-Channel Leakage Assessment with Architecture Correlation Analysis},
author = {Pantea Kiaei and Yuan Yao and Zhenyuan Liu and Nicole Fern and Cees{-}Bart Breunesse and Jasper Van Woudenberg and Kate Gillis and Alex Dich and Peter Grossmann and Patrick Schaumont},
year = 2022,
journal = {CoRR},
volume = {abs/2204.11972},
doi = {10.48550/arXiv.2204.11972},
url = {https://doi.org/10.48550/arXiv.2204.11972},
eprinttype = {arXiv},
eprint = {2204.11972},
timestamp = {Thu, 28 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/corr/abs-2204-11972.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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