Gate-Level Side-Channel Leakage Assessment with Architecture Correlation Analysis. Kiaei, P., Yao, Y., Liu, Z., Fern, N., Breunesse, C., Woudenberg, J. V., Gillis, K., Dich, A., Grossmann, P., & Schaumont, P. CoRR, 2022.
Gate-Level Side-Channel Leakage Assessment with Architecture Correlation Analysis [link]Paper  doi  bibtex   
@article{DBLP:journals/corr/abs-2204-11972,
  author       = {Pantea Kiaei and
                  Yuan Yao and
                  Zhenyuan Liu and
                  Nicole Fern and
                  Cees{-}Bart Breunesse and
                  Jasper Van Woudenberg and
                  Kate Gillis and
                  Alex Dich and
                  Peter Grossmann and
                  Patrick Schaumont},
  title        = {Gate-Level Side-Channel Leakage Assessment with Architecture Correlation
                  Analysis},
  journal      = {CoRR},
  volume       = {abs/2204.11972},
  year         = {2022},
  url          = {https://doi.org/10.48550/arXiv.2204.11972},
  doi          = {10.48550/ARXIV.2204.11972},
  eprinttype    = {arXiv},
  eprint       = {2204.11972},
  timestamp    = {Thu, 28 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/corr/abs-2204-11972.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

Downloads: 0