Gate-Level Side-Channel Leakage Ranking With Architecture Correlation Analysis. Kiaei, P., Yao, Y., Liu, Z., Fern, N., Breunesse, C., Woudenberg, J. V., Gillis, K., Dich, A., Grossmann, P., & Schaumont, P. IEEE Trans. Emerg. Top. Comput., 12(2):496–507, 2024.
Paper doi bibtex @article{DBLP:journals/tetc/KiaeiYLFBWGDGS24,
author = {Pantea Kiaei and
Yuan Yao and
Zhenyuan Liu and
Nicole Fern and
Cees{-}Bart Breunesse and
Jasper Van Woudenberg and
Kate Gillis and
Alex Dich and
Peter Grossmann and
Patrick Schaumont},
title = {Gate-Level Side-Channel Leakage Ranking With Architecture Correlation
Analysis},
journal = {{IEEE} Trans. Emerg. Top. Comput.},
volume = {12},
number = {2},
pages = {496--507},
year = {2024},
url = {https://doi.org/10.1109/TETC.2023.3268303},
doi = {10.1109/TETC.2023.3268303},
timestamp = {Thu, 22 Jan 2026 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tetc/KiaeiYLFBWGDGS24.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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