Gate-Level Side-Channel Leakage Ranking With Architecture Correlation Analysis. Kiaei, P., Yao, Y., Liu, Z., Fern, N., Breunesse, C., Woudenberg, J. V., Gillis, K., Dich, A., Grossmann, P., & Schaumont, P. IEEE Trans. Emerg. Top. Comput., 12(2):496–507, 2024.
Gate-Level Side-Channel Leakage Ranking With Architecture Correlation Analysis [link]Paper  doi  bibtex   
@article{DBLP:journals/tetc/KiaeiYLFBWGDGS24,
  author       = {Pantea Kiaei and
                  Yuan Yao and
                  Zhenyuan Liu and
                  Nicole Fern and
                  Cees{-}Bart Breunesse and
                  Jasper Van Woudenberg and
                  Kate Gillis and
                  Alex Dich and
                  Peter Grossmann and
                  Patrick Schaumont},
  title        = {Gate-Level Side-Channel Leakage Ranking With Architecture Correlation
                  Analysis},
  journal      = {{IEEE} Trans. Emerg. Top. Comput.},
  volume       = {12},
  number       = {2},
  pages        = {496--507},
  year         = {2024},
  url          = {https://doi.org/10.1109/TETC.2023.3268303},
  doi          = {10.1109/TETC.2023.3268303},
  timestamp    = {Thu, 22 Jan 2026 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tetc/KiaeiYLFBWGDGS24.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

Downloads: 0