@inproceedings{kim2016cross,
  title={[DAC'16] Invited - Cross-Layer Modeling And Optimization For Electromigration Induced Reliability},
  author={Kim, <br/> Taeyoung and Sun, Zeyu and Cook, Chase and Zhao, Hengyang and Li, Ruiwen and Wong</b>, <b>Daniel and Tan, Sheldon X-D},
  booktitle={Proceedings of the 53rd Annual Design Automation Conference (DAC))},
  year={2016},
  note={}
}

{"_id":"TsP5HxRDK6YGmxntK","bibbaseid":"kim-sun-cook-zhao-li-wongb-tan-dac16invitedcrosslayermodelingandoptimizationforelectromigrationinducedreliability-2016","author_short":["Kim, <. T.","Sun, Z.","Cook, C.","Zhao, H.","Li, R.","Wong</b>, <.","Tan, S. X."],"bibdata":{"bibtype":"inproceedings","type":"inproceedings","title":"[DAC'16] Invited - Cross-Layer Modeling And Optimization For Electromigration Induced Reliability","author":[{"propositions":[],"lastnames":["Kim"],"firstnames":["<br/>","Taeyoung"],"suffixes":[]},{"propositions":[],"lastnames":["Sun"],"firstnames":["Zeyu"],"suffixes":[]},{"propositions":[],"lastnames":["Cook"],"firstnames":["Chase"],"suffixes":[]},{"propositions":[],"lastnames":["Zhao"],"firstnames":["Hengyang"],"suffixes":[]},{"propositions":[],"lastnames":["Li"],"firstnames":["Ruiwen"],"suffixes":[]},{"propositions":[],"lastnames":["Wong</b>"],"firstnames":["<b>Daniel"],"suffixes":[]},{"propositions":[],"lastnames":["Tan"],"firstnames":["Sheldon","X-D"],"suffixes":[]}],"booktitle":"Proceedings of the 53rd Annual Design Automation Conference (DAC))","year":"2016","note":"","bibtex":"@inproceedings{kim2016cross,\n title={[DAC'16] Invited - Cross-Layer Modeling And Optimization For Electromigration Induced Reliability},\n author={Kim, <br/> Taeyoung and Sun, Zeyu and Cook, Chase and Zhao, Hengyang and Li, Ruiwen and Wong</b>, <b>Daniel and Tan, Sheldon X-D},\n booktitle={Proceedings of the 53rd Annual Design Automation Conference (DAC))},\n year={2016},\n note={}\n}\n\n","author_short":["Kim, <. T.","Sun, Z.","Cook, C.","Zhao, H.","Li, R.","Wong</b>, <.","Tan, S. X."],"key":"kim2016cross","id":"kim2016cross","bibbaseid":"kim-sun-cook-zhao-li-wongb-tan-dac16invitedcrosslayermodelingandoptimizationforelectromigrationinducedreliability-2016","role":"author","urls":{},"metadata":{"authorlinks":{}},"downloads":0,"html":""},"bibtype":"inproceedings","biburl":"danielwong.org/publication.bib","dataSources":["aLPopSyWTZ72WfLhv"],"keywords":[],"search_terms":["dac","invited","cross","layer","modeling","optimization","electromigration","induced","reliability","kim","sun","cook","zhao","li","wong</b>","tan"],"title":"[DAC'16] Invited - Cross-Layer Modeling And Optimization For Electromigration Induced Reliability","year":2016}