Large Area Imaging of Integrated Circuits Using Hard X-Ray Ptychography. Klug, J., Deng, J., Jiang, Y., Preissner, C., Di, Z. W., Bicer, T., Wild, S. M., Vogt, S., Sandberg, R., & Honig, S. Technical Report 17-2, Argonne, 2019.
bibtex   
@TechReport{Klug2019,
  author      = {Jeffrey Klug and Junjing Deng and Yi Jiang and Curt Preissner and Zichao Wendy Di and Tekin Bicer and Stefan M. Wild and Stefan Vogt and Richard Sandberg and Steven Honig},
  title       = {Large Area Imaging of Integrated Circuits Using Hard {X}-Ray Ptychography},
  institution = {Argonne},
  year        = {2019},
  number      = {17-2},
  aurl        = {https://www.gomactech.net/2019/},
}

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