Can We Trust Undervolting in FPGA-Based Deep Learning Designs at Harsh Conditions?. Koc, F., Salami, B., Ergin, O., Unsal, O. S., & Kestelman, A. C. IEEE Micro, 42(3):57-65, 2022.
Can We Trust Undervolting in FPGA-Based Deep Learning Designs at Harsh Conditions? [link]Link  Can We Trust Undervolting in FPGA-Based Deep Learning Designs at Harsh Conditions? [link]Paper  bibtex   
@article{journals/micro/KocSEUK22,
  added-at = {2024-02-05T00:00:00.000+0100},
  author = {Koc, Fahrettin and Salami, Behzad and Ergin, Oguz and Unsal, Osman S. and Kestelman, Adrián Cristal},
  biburl = {https://www.bibsonomy.org/bibtex/2dcf6db6e5040092863a448f529df0f17/dblp},
  ee = {https://doi.org/10.1109/MM.2022.3153891},
  interhash = {58c9677e1488abf1ac87385e8743f03d},
  intrahash = {dcf6db6e5040092863a448f529df0f17},
  journal = {IEEE Micro},
  keywords = {dblp},
  number = 3,
  pages = {57-65},
  timestamp = {2024-04-08T12:47:21.000+0200},
  title = {Can We Trust Undervolting in FPGA-Based Deep Learning Designs at Harsh Conditions?},
  url = {http://dblp.uni-trier.de/db/journals/micro/micro42.html#KocSEUK22},
  volume = 42,
  year = 2022
}

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