Potential biases in bug localization: Do they matter?. Kochhar, P. S., Tian, Y., & Lo, D. In Proceedings of the 29th ACM/IEEE international conference on Automated software engineering, pages 803–814, 2014.
bibtex   
@inproceedings{kochhar2014potential,
  title={Potential biases in bug localization: Do they matter?},
  author={Kochhar, Pavneet Singh and Tian, Yuan and Lo, David},
  booktitle={Proceedings of the 29th ACM/IEEE international conference on Automated software engineering},
  pages={803--814},
  year={2014}
}

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