Charge-based fault simulation for CMOS network breaks. Konuk, H., Ferguson, F. J., & Larrabee, T. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 15(12):1555-1567, 1996.
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Paper bibtex @article{journals/tcad/KonukFL96,
added-at = {2020-09-24T00:00:00.000+0200},
author = {Konuk, Haluk and Ferguson, F. Joel and Larrabee, Tracy},
biburl = {https://www.bibsonomy.org/bibtex/285aa41e5bb892c6e65831d7a2e25d420/dblp},
ee = {https://doi.org/10.1109/43.552089},
interhash = {104c8ba999b8a77829aba3348d0070e9},
intrahash = {85aa41e5bb892c6e65831d7a2e25d420},
journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.},
keywords = {dblp},
number = 12,
pages = {1555-1567},
timestamp = {2020-09-25T11:49:34.000+0200},
title = {Charge-based fault simulation for CMOS network breaks.},
url = {http://dblp.uni-trier.de/db/journals/tcad/tcad15.html#KonukFL96},
volume = 15,
year = 1996
}
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