Charge-based fault simulation for CMOS network breaks. Konuk, H., Ferguson, F. J., & Larrabee, T. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 15(12):1555-1567, 1996.
Charge-based fault simulation for CMOS network breaks. [link]Link  Charge-based fault simulation for CMOS network breaks. [link]Paper  bibtex   
@article{journals/tcad/KonukFL96,
  added-at = {2020-09-24T00:00:00.000+0200},
  author = {Konuk, Haluk and Ferguson, F. Joel and Larrabee, Tracy},
  biburl = {https://www.bibsonomy.org/bibtex/285aa41e5bb892c6e65831d7a2e25d420/dblp},
  ee = {https://doi.org/10.1109/43.552089},
  interhash = {104c8ba999b8a77829aba3348d0070e9},
  intrahash = {85aa41e5bb892c6e65831d7a2e25d420},
  journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.},
  keywords = {dblp},
  number = 12,
  pages = {1555-1567},
  timestamp = {2020-09-25T11:49:34.000+0200},
  title = {Charge-based fault simulation for CMOS network breaks.},
  url = {http://dblp.uni-trier.de/db/journals/tcad/tcad15.html#KonukFL96},
  volume = 15,
  year = 1996
}

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