@inproceedings{conf/ats/KookCNCGGJ09,
  added-at = {2016-01-13T00:00:00.000+0100},
  author = {Kook, Sehun and Choi, Hyun Woo and Natarajan, Vishwanath and Chatterjee, Abhijit and Gomes, Alfred V. and Goyal, Shalabh and Jin, Le},
  biburl = {http://www.bibsonomy.org/bibtex/27b6d98bd39d91580c9ad2c16bb30cb39/dblp},
  booktitle = {Asian Test Symposium},
  crossref = {conf/ats/2009},
  ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2009.76},
  interhash = {bb12dce7ebfb03ade3f8348227d5acfb},
  intrahash = {7b6d98bd39d91580c9ad2c16bb30cb39},
  isbn = {978-0-7695-3864-8},
  keywords = {dblp},
  pages = {69-74},
  publisher = {IEEE Computer Society},
  timestamp = {2016-01-15T11:36:21.000+0100},
  title = {Low Cost Dynamic Test Methodology for High Precision ΣD ADCs.},
  url = {http://dblp.uni-trier.de/db/conf/ats/ats2009.html#KookCNCGGJ09},
  year = 2009
}

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