A Weakly Fault Tolerant Design of Molecular Memory Cell. Kumawat, R., Sahula, V., & Gaur, M., S. In 4th IEEE International Workshop on Reliability Aware System Design and Test (RASDAT), pages 1-4, 2013.
bibtex   
@inproceedings{
 title = {A Weakly Fault Tolerant Design of Molecular Memory Cell},
 type = {inproceedings},
 year = {2013},
 pages = {1-4},
 id = {42def953-1ac8-394e-a6d4-17fb56c1299b},
 created = {2014-01-10T16:33:49.000Z},
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 profile_id = {03d2ca17-6bde-3cfe-95de-fcbe4f21507b},
 last_modified = {2017-03-14T01:22:09.162Z},
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 citation_key = {Kumawat2013},
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 bibtype = {inproceedings},
 author = {Kumawat, Renu and Sahula, Vineet and Gaur, M S},
 booktitle = {4th IEEE International Workshop on Reliability Aware System Design and Test (RASDAT)}
}

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