@inproceedings{
 title = {Modeling and Reliability Evaluation of logic Circuits at Nanoscale},
 type = {inproceedings},
 year = {2010},
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 citation_key = {kumawat2010rasdat},
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 bibtype = {inproceedings},
 author = {Kumawat, R. and Sahula, Vineet (MNIT Jaipur) and Gaur, M S and Laxmi, V},
 booktitle = {1st IEEE International Workshop on Reliability Aware System Design and Test}
}

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