Probabilistic model for nanocell reliability evaluation in presence of transient errors. Kumawat, R., Sahula, V., & Gaur, M. S. IET Comput. Digit. Tech., 9(4):213–220, 2015.
Probabilistic model for nanocell reliability evaluation in presence of transient errors [link]Paper  doi  bibtex   
@article{DBLP:journals/iet-cdt/KumawatSG15,
  author       = {Renu Kumawat and
                  Vineet Sahula and
                  Manoj Singh Gaur},
  title        = {Probabilistic model for nanocell reliability evaluation in presence
                  of transient errors},
  journal      = {{IET} Comput. Digit. Tech.},
  volume       = {9},
  number       = {4},
  pages        = {213--220},
  year         = {2015},
  url          = {https://doi.org/10.1049/iet-cdt.2014.0124},
  doi          = {10.1049/IET-CDT.2014.0124},
  timestamp    = {Tue, 14 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/iet-cdt/KumawatSG15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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