Reliable circuit analysis and design using nanoscale devices. Kumawat, R., Sahula, V., & Gaur, M., S. In International Conference on Communication and Electronics System Design, pages 87602C--87602C, 2013. SPIE. Paper bibtex @inproceedings{
title = {Reliable circuit analysis and design using nanoscale devices},
type = {inproceedings},
year = {2013},
pages = {87602C--87602C},
publisher = {SPIE},
institution = {International Society for Optics and Photonics},
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last_modified = {2017-03-14T01:22:09.162Z},
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bibtype = {inproceedings},
author = {Kumawat, Renu and Sahula, Vineet and Gaur, M S},
booktitle = {International Conference on Communication and Electronics System Design}
}
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