Reliable circuit analysis and design using nanoscale devices. Kumawat, R., Sahula, V., & Gaur, M., S. In International Conference on Communication and Electronics System Design, pages 87602C--87602C, 2013. SPIE.
bibtex   
@inproceedings{
 title = {Reliable circuit analysis and design using nanoscale devices},
 type = {inproceedings},
 year = {2013},
 pages = {87602C--87602C},
 publisher = {SPIE},
 institution = {International Society for Optics and Photonics},
 id = {a5e4a87a-fbb6-3ce2-aa73-63314d9b71c8},
 created = {2014-04-17T21:17:22.000Z},
 file_attached = {true},
 profile_id = {03d2ca17-6bde-3cfe-95de-fcbe4f21507b},
 last_modified = {2017-03-14T01:22:09.162Z},
 read = {false},
 starred = {false},
 authored = {true},
 confirmed = {true},
 hidden = {false},
 citation_key = {kumawat2013reliable},
 source_type = {inproceedings},
 private_publication = {false},
 bibtype = {inproceedings},
 author = {Kumawat, Renu and Sahula, Vineet and Gaur, M S},
 booktitle = {International Conference on Communication and Electronics System Design}
}

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