Fast Irreducibility Testing for XTR Using a Gaussian Normal Basis of Low Complexity. Kwon, S., Kim, C. H., & Hong, C. P. In Handschuh, H. & Hasan, M. A., editors, Selected Areas in Cryptography, volume 3357, of Lecture Notes in Computer Science, pages 144-158, 2004. Springer.
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Paper bibtex @inproceedings{conf/sacrypt/KwonKH04,
added-at = {2018-06-26T00:00:00.000+0200},
author = {Kwon, Soonhak and Kim, Chang Hoon and Hong, Chun Pyo},
biburl = {https://www.bibsonomy.org/bibtex/2bd0007812167b22181f84f82d32bcb9a/dblp},
booktitle = {Selected Areas in Cryptography},
crossref = {conf/sacrypt/2004},
editor = {Handschuh, Helena and Hasan, M. Anwar},
ee = {https://doi.org/10.1007/978-3-540-30564-4_10},
interhash = {831737f9f7638e8dcaac227c658a25ce},
intrahash = {bd0007812167b22181f84f82d32bcb9a},
isbn = {3-540-24327-5},
keywords = {dblp},
pages = {144-158},
publisher = {Springer},
series = {Lecture Notes in Computer Science},
timestamp = {2018-06-27T12:55:47.000+0200},
title = {Fast Irreducibility Testing for XTR Using a Gaussian Normal Basis of Low Complexity.},
url = {http://dblp.uni-trier.de/db/conf/sacrypt/sacrypt2004.html#KwonKH04},
volume = 3357,
year = 2004
}
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