Fast Irreducibility Testing for XTR Using a Gaussian Normal Basis of Low Complexity.

Fast Irreducibility Testing for XTR Using a Gaussian Normal Basis of Low Complexity. Kwon, S.; Kim, C. H.; and Hong, C. P. In Handschuh, H. and Hasan, M. A., editors, Selected Areas in Cryptography, volume 3357, of Lecture Notes in Computer Science, pages 144-158, 2004. Springer.

Link

Paper bibtex

@inproceedings{conf/sacrypt/KwonKH04,
  added-at = {2018-06-26T00:00:00.000+0200},
  author = {Kwon, Soonhak and Kim, Chang Hoon and Hong, Chun Pyo},
  biburl = {https://www.bibsonomy.org/bibtex/2bd0007812167b22181f84f82d32bcb9a/dblp},
  booktitle = {Selected Areas in Cryptography},
  crossref = {conf/sacrypt/2004},
  editor = {Handschuh, Helena and Hasan, M. Anwar},
  ee = {https://doi.org/10.1007/978-3-540-30564-4_10},
  interhash = {831737f9f7638e8dcaac227c658a25ce},
  intrahash = {bd0007812167b22181f84f82d32bcb9a},
  isbn = {3-540-24327-5},
  keywords = {dblp},
  pages = {144-158},
  publisher = {Springer},
  series = {Lecture Notes in Computer Science},
  timestamp = {2018-06-27T12:55:47.000+0200},
  title = {Fast Irreducibility Testing for XTR Using a Gaussian Normal Basis of Low Complexity.},
  url = {http://dblp.uni-trier.de/db/conf/sacrypt/sacrypt2004.html#KwonKH04},
  volume = 3357,
  year = 2004
}

Downloads: 0