Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images. LeBeau, J. M, D'Alfonso, A. J, Findlay, S. D, Stemmer, S., & Allen, L. J Phys. Rev. B: Condens. Matter Mater. Phys., APS, November, 2009. doi abstract bibtex Quantitative, atomic resolution bright-field scanning transmission electron microscopy experiments are reported. The image intensities are placed on an absolute scale relative to the incident beam intensity. Features in the experimental images, such as contrast reversals, intensities, and the image contrast, are compared with image simulations that account for elastic scattering and the effect of phonon scattering. Simulations are carried out using both the multislice absorptive and frozen phonon simulation methods. For a SrTiO(3) sample with thicknesses between 4 and 25 nm, both models agree within the experimental uncertainty. We demonstrate excellent agreement between the simulated and the experimentally observed image contrast. The implications for the contrast mismatch commonly reported for high-resolution transmission electron microscopy using plane-wave illumination are discussed.
@ARTICLE{LeBeau2009-hs,
title = "Quantitative comparisons of contrast in experimental and
simulated bright-field scanning transmission electron microscopy
images",
author = "LeBeau, James M and D'Alfonso, Adrian J and Findlay, Scott D and
Stemmer, Susanne and Allen, Leslie J",
abstract = "Quantitative, atomic resolution bright-field scanning
transmission electron microscopy experiments are reported. The
image intensities are placed on an absolute scale relative to
the incident beam intensity. Features in the experimental
images, such as contrast reversals, intensities, and the image
contrast, are compared with image simulations that account for
elastic scattering and the effect of phonon scattering.
Simulations are carried out using both the multislice absorptive
and frozen phonon simulation methods. For a SrTiO(3) sample with
thicknesses between 4 and 25 nm, both models agree within the
experimental uncertainty. We demonstrate excellent agreement
between the simulated and the experimentally observed image
contrast. The implications for the contrast mismatch commonly
reported for high-resolution transmission electron microscopy
using plane-wave illumination are discussed.",
journal = "Phys. Rev. B: Condens. Matter Mater. Phys.",
publisher = "APS",
volume = 80,
number = 17,
month = nov,
year = 2009,
keywords = "phonons;scanning electron microscopy;stem;strontium
compounds;transmission electron
microscopy;LeBeau;HfO2;QSTEMChapter",
language = "English",
issn = "1098-0121",
doi = "10.1103/PhysRevB.80.174106"
}
% The entry below contains non-ASCII chars that could not be converted
% to a LaTeX equivalent.
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