@ARTICLE{LeBeau2009-hs,
  title     = "Quantitative comparisons of contrast in experimental and
               simulated bright-field scanning transmission electron microscopy
               images",
  author    = "LeBeau, James M and D'Alfonso, Adrian J and Findlay, Scott D and
               Stemmer, Susanne and Allen, Leslie J",
  abstract  = "Quantitative, atomic resolution bright-field scanning
               transmission electron microscopy experiments are reported. The
               image intensities are placed on an absolute scale relative to
               the incident beam intensity. Features in the experimental
               images, such as contrast reversals, intensities, and the image
               contrast, are compared with image simulations that account for
               elastic scattering and the effect of phonon scattering.
               Simulations are carried out using both the multislice absorptive
               and frozen phonon simulation methods. For a SrTiO(3) sample with
               thicknesses between 4 and 25 nm, both models agree within the
               experimental uncertainty. We demonstrate excellent agreement
               between the simulated and the experimentally observed image
               contrast. The implications for the contrast mismatch commonly
               reported for high-resolution transmission electron microscopy
               using plane-wave illumination are discussed.",
  journal   = "Phys. Rev. B: Condens. Matter Mater. Phys.",
  publisher = "APS",
  volume    =  80,
  number    =  17,
  month     =  nov,
  year      =  2009,
  keywords  = "phonons;scanning electron microscopy;stem;strontium
               compounds;transmission electron
               microscopy;LeBeau;HfO2;QSTEMChapter",
  language  = "English",
  issn      = "1098-0121",
  doi       = "10.1103/PhysRevB.80.174106"
}

% The entry below contains non-ASCII chars that could not be converted
% to a LaTeX equivalent.

{"_id":"PiTSHySb28vmYbYTq","bibbaseid":"lebeau-dalfonso-findlay-stemmer-allen-quantitativecomparisonsofcontrastinexperimentalandsimulatedbrightfieldscanningtransmissionelectronmicroscopyimages-2009","author_short":["LeBeau, J. M","D'Alfonso, A. J","Findlay, S. D","Stemmer, S.","Allen, L. J"],"bibdata":{"bibtype":"article","type":"article","title":"Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images","author":[{"propositions":[],"lastnames":["LeBeau"],"firstnames":["James","M"],"suffixes":[]},{"propositions":[],"lastnames":["D'Alfonso"],"firstnames":["Adrian","J"],"suffixes":[]},{"propositions":[],"lastnames":["Findlay"],"firstnames":["Scott","D"],"suffixes":[]},{"propositions":[],"lastnames":["Stemmer"],"firstnames":["Susanne"],"suffixes":[]},{"propositions":[],"lastnames":["Allen"],"firstnames":["Leslie","J"],"suffixes":[]}],"abstract":"Quantitative, atomic resolution bright-field scanning transmission electron microscopy experiments are reported. The image intensities are placed on an absolute scale relative to the incident beam intensity. Features in the experimental images, such as contrast reversals, intensities, and the image contrast, are compared with image simulations that account for elastic scattering and the effect of phonon scattering. Simulations are carried out using both the multislice absorptive and frozen phonon simulation methods. For a SrTiO(3) sample with thicknesses between 4 and 25 nm, both models agree within the experimental uncertainty. We demonstrate excellent agreement between the simulated and the experimentally observed image contrast. The implications for the contrast mismatch commonly reported for high-resolution transmission electron microscopy using plane-wave illumination are discussed.","journal":"Phys. Rev. B: Condens. Matter Mater. Phys.","publisher":"APS","volume":"80","number":"17","month":"November","year":"2009","keywords":"phonons;scanning electron microscopy;stem;strontium compounds;transmission electron microscopy;LeBeau;HfO2;QSTEMChapter","language":"English","issn":"1098-0121","doi":"10.1103/PhysRevB.80.174106","bibtex":"@ARTICLE{LeBeau2009-hs,\n title = \"Quantitative comparisons of contrast in experimental and\n simulated bright-field scanning transmission electron microscopy\n images\",\n author = \"LeBeau, James M and D'Alfonso, Adrian J and Findlay, Scott D and\n Stemmer, Susanne and Allen, Leslie J\",\n abstract = \"Quantitative, atomic resolution bright-field scanning\n transmission electron microscopy experiments are reported. The\n image intensities are placed on an absolute scale relative to\n the incident beam intensity. Features in the experimental\n images, such as contrast reversals, intensities, and the image\n contrast, are compared with image simulations that account for\n elastic scattering and the effect of phonon scattering.\n Simulations are carried out using both the multislice absorptive\n and frozen phonon simulation methods. For a SrTiO(3) sample with\n thicknesses between 4 and 25 nm, both models agree within the\n experimental uncertainty. We demonstrate excellent agreement\n between the simulated and the experimentally observed image\n contrast. The implications for the contrast mismatch commonly\n reported for high-resolution transmission electron microscopy\n using plane-wave illumination are discussed.\",\n journal = \"Phys. Rev. B: Condens. Matter Mater. Phys.\",\n publisher = \"APS\",\n volume = 80,\n number = 17,\n month = nov,\n year = 2009,\n keywords = \"phonons;scanning electron microscopy;stem;strontium\n compounds;transmission electron\n microscopy;LeBeau;HfO2;QSTEMChapter\",\n language = \"English\",\n issn = \"1098-0121\",\n doi = \"10.1103/PhysRevB.80.174106\"\n}\n\n% The entry below contains non-ASCII chars that could not be converted\n% to a LaTeX equivalent.\n","author_short":["LeBeau, J. M","D'Alfonso, A. J","Findlay, S. D","Stemmer, S.","Allen, L. J"],"key":"LeBeau2009-hs","id":"LeBeau2009-hs","bibbaseid":"lebeau-dalfonso-findlay-stemmer-allen-quantitativecomparisonsofcontrastinexperimentalandsimulatedbrightfieldscanningtransmissionelectronmicroscopyimages-2009","role":"author","urls":{},"keyword":["phonons;scanning electron microscopy;stem;strontium compounds;transmission electron microscopy;LeBeau;HfO2;QSTEMChapter"],"metadata":{"authorlinks":{}}},"bibtype":"article","biburl":"https://paperpile.com/eb/hvQdZzcQAp","dataSources":["XvQYbdoqrgtkncm5N","PMupqmDbRNFndeT5W"],"keywords":["phonons;scanning electron microscopy;stem;strontium compounds;transmission electron microscopy;lebeau;hfo2;qstemchapter"],"search_terms":["quantitative","comparisons","contrast","experimental","simulated","bright","field","scanning","transmission","electron","microscopy","images","lebeau","d'alfonso","findlay","stemmer","allen"],"title":"Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images","year":2009}