Multi-Level Fault Injections in VHDL Descriptions: Alternative Approaches and Experiments. Leveugle, R. & Hadjiat, K. J. Electronic Testing (ET), 19(5):559-575, 2003. Paper bibtex @article{ dblp3799352,
title = {Multi-Level Fault Injections in VHDL Descriptions: Alternative Approaches and Experiments},
author = {Régis Leveugle and K. Hadjiat},
author_short = {Leveugle, R. and Hadjiat, K.},
bibtype = {article},
type = {article},
year = {2003},
key = {dblp3799352},
id = {dblp3799352},
biburl = {http://www.dblp.org/rec/bibtex/journals/et/LeveugleH03},
url = {http://dx.doi.org/10.1023/A:1025178014797},
journal = {J. Electronic Testing (ET)},
pages = {559-575},
number = {5},
volume = {19},
text = {J. Electronic Testing (ET) 19(5):559-575 (2003)}
}
Downloads: 0
{"_id":{"_str":"5284dbc514a66df4430011c3"},"__v":7,"authorIDs":["545988ebb43425b7720006c7"],"author_short":["Leveugle, R.","Hadjiat, K."],"bibbaseid":"leveugle-hadjiat-multilevelfaultinjectionsinvhdldescriptionsalternativeapproachesandexperiments-2003","bibdata":{"title":"Multi-Level Fault Injections in VHDL Descriptions: Alternative Approaches and Experiments","author":["Régis Leveugle","K. Hadjiat"],"author_short":["Leveugle, R.","Hadjiat, K."],"bibtype":"article","type":"article","year":"2003","key":"dblp3799352","id":"dblp3799352","biburl":"http://www.dblp.org/rec/bibtex/journals/et/LeveugleH03","url":"http://dx.doi.org/10.1023/A:1025178014797","journal":"J. Electronic Testing (ET)","pages":"559-575","number":"5","volume":"19","text":"J. Electronic Testing (ET) 19(5):559-575 (2003)","bibtex":"@article{ dblp3799352,\n title = {Multi-Level Fault Injections in VHDL Descriptions: Alternative Approaches and Experiments},\n author = {Régis Leveugle and K. Hadjiat},\n author_short = {Leveugle, R. and Hadjiat, K.},\n bibtype = {article},\n type = {article},\n year = {2003},\n key = {dblp3799352},\n id = {dblp3799352},\n biburl = {http://www.dblp.org/rec/bibtex/journals/et/LeveugleH03},\n url = {http://dx.doi.org/10.1023/A:1025178014797},\n journal = {J. Electronic Testing (ET)},\n pages = {559-575},\n number = {5},\n volume = {19},\n text = {J. Electronic Testing (ET) 19(5):559-575 (2003)}\n}","bibbaseid":"leveugle-hadjiat-multilevelfaultinjectionsinvhdldescriptionsalternativeapproachesandexperiments-2003","role":"author","urls":{"Paper":"http://dx.doi.org/10.1023/A:1025178014797"},"downloads":0},"bibtype":"article","biburl":"http://www.dblp.org/rec/bibtex/journals/et/LeveugleH03","downloads":0,"keywords":[],"search_terms":["multi","level","fault","injections","vhdl","descriptions","alternative","approaches","experiments","leveugle","hadjiat"],"title":"Multi-Level Fault Injections in VHDL Descriptions: Alternative Approaches and Experiments","year":2003,"dataSources":["3qpE4c7aPh66YvHyr"]}