On the Repudiability of Device Identification and Image Integrity Verification Using Sensor Pattern Noise. Li, C., Chang, C., & Li, Y. In ISDF, volume 41, of Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, pages 19-25, 2009. Springer.
On the Repudiability of Device Identification and Image Integrity Verification Using Sensor Pattern Noise. [link]Link  On the Repudiability of Device Identification and Image Integrity Verification Using Sensor Pattern Noise. [link]Paper  bibtex   
@inproceedings{conf/isdf/LiCL09,
  added-at = {2019-11-29T00:00:00.000+0100},
  author = {Li, Chang-Tsun and Chang, Chih-Yuan and Li, Yue},
  biburl = {https://www.bibsonomy.org/bibtex/29b21e7f15b0933ee7436b1a8c486117e/dblp},
  booktitle = {ISDF},
  crossref = {conf/isdf/2009},
  editor = {Weerasinghe, Dasun},
  ee = {http://eudl.eu/doi/10.1007/978-3-642-11530-1_3},
  interhash = {e3b0cab32322dcad060c8177d4afed59},
  intrahash = {9b21e7f15b0933ee7436b1a8c486117e},
  isbn = {978-3-642-11529-5},
  keywords = {dblp},
  pages = {19-25},
  publisher = {Springer},
  series = {Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering},
  timestamp = {2019-11-30T11:40:50.000+0100},
  title = {On the Repudiability of Device Identification and Image Integrity Verification Using Sensor Pattern Noise.},
  url = {http://dblp.uni-trier.de/db/conf/isdf/isdf2009.html#LiCL09},
  volume = 41,
  year = 2009
}

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