Atom probe tomography characterization of heavily cold drawn pearlitic steel wire. Li, Y., Choi, P., Borchers, C., Chen, Y., Goto, S., Raabe, D., & Kirchheim, R. Ultramicroscopy, 111:628–632, Elsevier BV, 2011. Paper doi bibtex @article{10.1016/j.ultramic.2010.11.010,
doi = {10.1016/j.ultramic.2010.11.010},
url = {http://dx.doi.org/10.1016/j.ultramic.2010.11.010},
year = 2011,
publisher = {Elsevier {BV}},
volume = {111},
pages = {628--632},
author = {Y.J. Li and P. Choi and C. Borchers and Y.Z. Chen and S. Goto and D. Raabe and R. Kirchheim},
title = {Atom probe tomography characterization of heavily cold drawn pearlitic steel wire},
journal = {Ultramicroscopy}
}
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