Modeling of Failure Probability and Statistical Design of Spin-Torque Transfer Magnetic RAM (STT MRAM) Array for Yield Enhancement. Li, J. & Roy, K. In SRC Technology and Talent for the 21st Century Technology (TECHCON), 2008.
bibtex   
@inproceedings{li2008techcon,
 author = {Jing  Li and  Kaushik  Roy},
 title = {Modeling of Failure Probability and Statistical Design of Spin-Torque Transfer Magnetic {RAM} ({STT MRAM}) Array for Yield Enhancement},
 booktitle = {SRC Technology and Talent for the 21st Century Technology (TECHCON)},
 year = {2008},
 keywords = {conference},
}

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