@article{journals/ese/LiWGHH18,
  added-at = {2018-02-15T00:00:00.000+0100},
  author = {Li, Xue-Lin and Wong, W. Eric and Gao, Ruizhi and Hu, Linghuan and Hosono, Shigeru},
  biburl = {https://www.bibsonomy.org/bibtex/28834ab9c02299dd0f38e8360059bb13c/dblp},
  ee = {https://doi.org/10.1007/s10664-016-9494-9},
  interhash = {3cf91064507cafbd1467ae75df355ff0},
  intrahash = {8834ab9c02299dd0f38e8360059bb13c},
  journal = {Empirical Software Engineering},
  keywords = {dblp},
  number = 1,
  pages = {1-51},
  timestamp = {2018-02-16T11:36:06.000+0100},
  title = {Genetic Algorithm-based Test Generation for Software Product Line with the Integration of Fault Localization Techniques.},
  url = {http://dblp.uni-trier.de/db/journals/ese/ese23.html#LiWGHH18},
  volume = 23,
  year = 2018
}

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