X-Ray Spectral Measurement and Interpretation. Lifshin, E., Ciccarelli, M. F., & Bolon, R. B. In Goldstein, J. I. & Yakowitz, H., editors, Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis, pages 263–297. Springer US, Boston, MA, 1975. ![X-Ray Spectral Measurement and Interpretation [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi abstract bibtex Chemical analysis in the scanning electron microscope and electron microprobe is performed by measuring the energy and intensity distribution of the x-ray signal generated by a focused electron beam. The subject of x-ray production has already been introduced in the chapter on electron beam-specimen interactions (Chapter III), which describes the mechanisms for both characteristic and continuum x-ray production. This chapter is concerned with the methods for detecting and measuring these signals as well as converting them into a useful form for qualitative and quantitative analysis.
@incollection{lifshin_x-ray_1975,
address = {Boston, MA},
title = {X-{Ray} {Spectral} {Measurement} and {Interpretation}},
isbn = {978-1-4613-4422-3},
url = {https://doi.org/10.1007/978-1-4613-4422-3_7},
abstract = {Chemical analysis in the scanning electron microscope and electron microprobe is performed by measuring the energy and intensity distribution of the x-ray signal generated by a focused electron beam. The subject of x-ray production has already been introduced in the chapter on electron beam-specimen interactions (Chapter III), which describes the mechanisms for both characteristic and continuum x-ray production. This chapter is concerned with the methods for detecting and measuring these signals as well as converting them into a useful form for qualitative and quantitative analysis.},
language = {en},
urldate = {2020-03-28},
booktitle = {Practical {Scanning} {Electron} {Microscopy}: {Electron} and {Ion} {Microprobe} {Analysis}},
publisher = {Springer US},
author = {Lifshin, E. and Ciccarelli, M. F. and Bolon, R. B.},
editor = {Goldstein, Joseph I. and Yakowitz, Harvey},
year = {1975},
doi = {10.1007/978-1-4613-4422-3_7},
keywords = {Counter Tube, Crystal Spectrometer, Focus Electron Beam, Proportional Counter, Solid State Detector},
pages = {263--297},
}
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