@inproceedings{conf/vlsi-dat/LinWC15,
  added-at = {2015-09-28T00:00:00.000+0200},
  author = {Lin, Bing-Yang and Wu, Cheng-Wen and Chen, Harry H.},
  biburl = {https://www.bibsonomy.org/bibtex/2edad34363e66823a083292e7179db085/dblp},
  booktitle = {VLSI-DAT},
  crossref = {conf/vlsi-dat/2015},
  ee = {http://dx.doi.org/10.1109/VLSI-DAT.2015.7114508},
  interhash = {829d852d5458f88a9932936df0fcd018},
  intrahash = {edad34363e66823a083292e7179db085},
  isbn = {978-1-4799-6275-4},
  keywords = {dblp},
  pages = {1-4},
  publisher = {IEEE},
  timestamp = {2015-09-29T11:36:26.000+0200},
  title = {System-level test coverage prediction by structural stress test data mining.},
  url = {http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2015.html#LinWC15},
  year = 2015
}

{"_id":"BTYxokrTEZPeaE4mC","bibbaseid":"lin-wu-chen-systemleveltestcoveragepredictionbystructuralstresstestdatamining-2015","authorIDs":[],"author_short":["Lin, B.","Wu, C.","Chen, H. H."],"bibdata":{"bibtype":"inproceedings","type":"inproceedings","added-at":"2015-09-28T00:00:00.000+0200","author":[{"propositions":[],"lastnames":["Lin"],"firstnames":["Bing-Yang"],"suffixes":[]},{"propositions":[],"lastnames":["Wu"],"firstnames":["Cheng-Wen"],"suffixes":[]},{"propositions":[],"lastnames":["Chen"],"firstnames":["Harry","H."],"suffixes":[]}],"biburl":"https://www.bibsonomy.org/bibtex/2edad34363e66823a083292e7179db085/dblp","booktitle":"VLSI-DAT","crossref":"conf/vlsi-dat/2015","ee":"http://dx.doi.org/10.1109/VLSI-DAT.2015.7114508","interhash":"829d852d5458f88a9932936df0fcd018","intrahash":"edad34363e66823a083292e7179db085","isbn":"978-1-4799-6275-4","keywords":"dblp","pages":"1-4","publisher":"IEEE","timestamp":"2015-09-29T11:36:26.000+0200","title":"System-level test coverage prediction by structural stress test data mining.","url":"http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2015.html#LinWC15","year":"2015","bibtex":"@inproceedings{conf/vlsi-dat/LinWC15,\n added-at = {2015-09-28T00:00:00.000+0200},\n author = {Lin, Bing-Yang and Wu, Cheng-Wen and Chen, Harry H.},\n biburl = {https://www.bibsonomy.org/bibtex/2edad34363e66823a083292e7179db085/dblp},\n booktitle = {VLSI-DAT},\n crossref = {conf/vlsi-dat/2015},\n ee = {http://dx.doi.org/10.1109/VLSI-DAT.2015.7114508},\n interhash = {829d852d5458f88a9932936df0fcd018},\n intrahash = {edad34363e66823a083292e7179db085},\n isbn = {978-1-4799-6275-4},\n keywords = {dblp},\n pages = {1-4},\n publisher = {IEEE},\n timestamp = {2015-09-29T11:36:26.000+0200},\n title = {System-level test coverage prediction by structural stress test data mining.},\n url = {http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2015.html#LinWC15},\n year = 2015\n}\n\n","author_short":["Lin, B.","Wu, C.","Chen, H. H."],"key":"conf/vlsi-dat/LinWC15","id":"conf/vlsi-dat/LinWC15","bibbaseid":"lin-wu-chen-systemleveltestcoveragepredictionbystructuralstresstestdatamining-2015","role":"author","urls":{"Link":"http://dx.doi.org/10.1109/VLSI-DAT.2015.7114508","Paper":"http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2015.html#LinWC15"},"keyword":["dblp"],"downloads":0},"bibtype":"inproceedings","biburl":"http://www.bibsonomy.org/bib/author/yang lin?items=1000","creationDate":"2019-08-22T03:53:54.168Z","downloads":0,"keywords":["dblp"],"search_terms":["system","level","test","coverage","prediction","structural","stress","test","data","mining","lin","wu","chen"],"title":"System-level test coverage prediction by structural stress test data mining.","year":2015,"dataSources":["a57oXwvfTysj8WtNo"]}