A true random number generator using time-dependent dielectric breakdown. Liu, N., Pinckney, N., Hanson, S., Sylvester, D., & Blaauw, D. In VLSI Circuits (VLSIC), 2011 Symposium on, pages 216–217, 2011. IEEE.
A true random number generator using time-dependent dielectric breakdown [link]Paper  bibtex   
@inproceedings{liu_true_2011,
	title = {A true random number generator using time-dependent dielectric breakdown},
	url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5986112},
	urldate = {2015-01-17TZ},
	booktitle = {{VLSI} {Circuits} ({VLSIC}), 2011 {Symposium} on},
	publisher = {IEEE},
	author = {Liu, Nurrachman and Pinckney, Nathaniel and Hanson, Scott and Sylvester, Dennis and Blaauw, David},
	year = {2011},
	keywords = {⛔ No DOI found},
	pages = {216--217}
}

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