Support Vector Machines for Anti-pattern Detection. Maiga, A., Ali, N., Bhattacharya, N., Saban�, A., Gu�h�neuc, Y., Antoniol, G., & Aimeur, E. In Menzies, T. & Saeki, M., editors, Proceedings of the 27<sup>th</sup> Conference on Automated Software Engineering (ASE), pages 278–281, September, 2012. ACM Press. 4 pages. Short paper.
Paper abstract bibtex Developers may introduce anti-patterns in their software systems because of time pressure, lack of understanding, communication, and–or skills. Anti-patterns impede development and maintenance activities by making the source code more difficult to understand. Detecting anti-patterns in a whole software system may be infeasible because of the required parsing time and of the subsequent needed manual validation. Detecting anti-patterns on subsets of a system could reduce costs, effort, and resources. Researchers have proposed approaches to detect occurrences of anti-patterns but these approaches have currently some limitations: they require extensive knowledge of anti-patterns, they have limited precision and recall, and they cannot be applied on subsets of systems. To overcome these limitations, we introduce SVMDetect, a novel approach to detect anti-patterns, based on a machine learning technique—support vector machines. Indeed, through an empirical study involving three subject systems and four anti-patterns, we showed that the accuracy of SVMDetect is greater than of DETEX when detecting anti-patterns occurrences on a set of classes. Concerning, the whole system, SVMDetect is able to find more anti-patterns occurrences than DETEX.
@INPROCEEDINGS{Maiga12-ASE-FeedbackAntipatterns,
AUTHOR = {Abddou Maiga and Nasir Ali and Neelesh Bhattacharya and
Aminata Saban� and Yann-Ga�l Gu�h�neuc and Giuliano Antoniol and
Esma Aimeur},
BOOKTITLE = {Proceedings of the 27<sup>th</sup> Conference on Automated Software Engineering (ASE)},
TITLE = {Support Vector Machines for Anti-pattern Detection},
YEAR = {2012},
OPTADDRESS = {},
OPTCROSSREF = {},
EDITOR = {Tim Menzies and Motoshi Saeki},
MONTH = {September},
NOTE = {4 pages. Short paper.},
OPTNUMBER = {},
OPTORGANIZATION = {},
PAGES = {278--281},
PUBLISHER = {ACM Press},
OPTSERIES = {},
OPTVOLUME = {},
KEYWORDS = {Topic: <b>Code and design smells</b>, Venue: <c>ASE</c>},
URL = {http://www.ptidej.net/publications/documents/ASE12.doc.pdf},
PDF = {http://www.ptidej.net/publications/documents/ASE12.ppt.pdf},
ABSTRACT = {Developers may introduce anti-patterns in their software
systems because of time pressure, lack of understanding,
communication, and--or skills. Anti-patterns impede development and
maintenance activities by making the source code more difficult to
understand. Detecting anti-patterns in a whole software system may be
infeasible because of the required parsing time and of the subsequent
needed manual validation. Detecting anti-patterns on subsets of a
system could reduce costs, effort, and resources. Researchers have
proposed approaches to detect occurrences of anti-patterns but these
approaches have currently some limitations: they require extensive
knowledge of anti-patterns, they have limited precision and recall,
and they cannot be applied on subsets of systems. To overcome these
limitations, we introduce SVMDetect, a novel approach to detect
anti-patterns, based on a machine learning technique---support vector
machines. Indeed, through an empirical study involving three subject
systems and four anti-patterns, we showed that the accuracy of
SVMDetect is greater than of DETEX when detecting anti-patterns
occurrences on a set of classes. Concerning, the whole system,
SVMDetect is able to find more anti-patterns occurrences than DETEX.}
}
Downloads: 0
{"_id":"4hFJ9So5dqi5ayNP6","bibbaseid":"maiga-ali-bhattacharya-saban-guhneuc-antoniol-aimeur-supportvectormachinesforantipatterndetection-2012","downloads":0,"creationDate":"2018-01-17T20:29:42.391Z","title":"Support Vector Machines for Anti-pattern Detection","author_short":["Maiga, A.","Ali, N.","Bhattacharya, N.","Saban�, A.","Gu�h�neuc, Y.","Antoniol, G.","Aimeur, E."],"year":2012,"bibtype":"inproceedings","biburl":"http://www.yann-gael.gueheneuc.net/Work/Publications/Biblio/complete-bibliography.bib","bibdata":{"bibtype":"inproceedings","type":"inproceedings","author":[{"firstnames":["Abddou"],"propositions":[],"lastnames":["Maiga"],"suffixes":[]},{"firstnames":["Nasir"],"propositions":[],"lastnames":["Ali"],"suffixes":[]},{"firstnames":["Neelesh"],"propositions":[],"lastnames":["Bhattacharya"],"suffixes":[]},{"firstnames":["Aminata"],"propositions":[],"lastnames":["Saban�"],"suffixes":[]},{"firstnames":["Yann-Ga�l"],"propositions":[],"lastnames":["Gu�h�neuc"],"suffixes":[]},{"firstnames":["Giuliano"],"propositions":[],"lastnames":["Antoniol"],"suffixes":[]},{"firstnames":["Esma"],"propositions":[],"lastnames":["Aimeur"],"suffixes":[]}],"booktitle":"Proceedings of the 27<sup>th</sup> Conference on Automated Software Engineering (ASE)","title":"Support Vector Machines for Anti-pattern Detection","year":"2012","optaddress":"","optcrossref":"","editor":[{"firstnames":["Tim"],"propositions":[],"lastnames":["Menzies"],"suffixes":[]},{"firstnames":["Motoshi"],"propositions":[],"lastnames":["Saeki"],"suffixes":[]}],"month":"September","note":"4 pages. Short paper.","optnumber":"","optorganization":"","pages":"278–281","publisher":"ACM Press","optseries":"","optvolume":"","keywords":"Topic: <b>Code and design smells</b>, Venue: <c>ASE</c>","url":"http://www.ptidej.net/publications/documents/ASE12.doc.pdf","pdf":"http://www.ptidej.net/publications/documents/ASE12.ppt.pdf","abstract":"Developers may introduce anti-patterns in their software systems because of time pressure, lack of understanding, communication, and–or skills. Anti-patterns impede development and maintenance activities by making the source code more difficult to understand. Detecting anti-patterns in a whole software system may be infeasible because of the required parsing time and of the subsequent needed manual validation. Detecting anti-patterns on subsets of a system could reduce costs, effort, and resources. Researchers have proposed approaches to detect occurrences of anti-patterns but these approaches have currently some limitations: they require extensive knowledge of anti-patterns, they have limited precision and recall, and they cannot be applied on subsets of systems. To overcome these limitations, we introduce SVMDetect, a novel approach to detect anti-patterns, based on a machine learning technique—support vector machines. Indeed, through an empirical study involving three subject systems and four anti-patterns, we showed that the accuracy of SVMDetect is greater than of DETEX when detecting anti-patterns occurrences on a set of classes. Concerning, the whole system, SVMDetect is able to find more anti-patterns occurrences than DETEX.","bibtex":"@INPROCEEDINGS{Maiga12-ASE-FeedbackAntipatterns,\r\n AUTHOR = {Abddou Maiga and Nasir Ali and Neelesh Bhattacharya and \r\n Aminata Saban� and Yann-Ga�l Gu�h�neuc and Giuliano Antoniol and \r\n Esma Aimeur},\r\n BOOKTITLE = {Proceedings of the 27<sup>th</sup> Conference on Automated Software Engineering (ASE)},\r\n TITLE = {Support Vector Machines for Anti-pattern Detection},\r\n YEAR = {2012},\r\n OPTADDRESS = {},\r\n OPTCROSSREF = {},\r\n EDITOR = {Tim Menzies and Motoshi Saeki},\r\n MONTH = {September},\r\n NOTE = {4 pages. Short paper.},\r\n OPTNUMBER = {},\r\n OPTORGANIZATION = {},\r\n PAGES = {278--281},\r\n PUBLISHER = {ACM Press},\r\n OPTSERIES = {},\r\n OPTVOLUME = {},\r\n KEYWORDS = {Topic: <b>Code and design smells</b>, Venue: <c>ASE</c>},\r\n URL = {http://www.ptidej.net/publications/documents/ASE12.doc.pdf},\r\n PDF = {http://www.ptidej.net/publications/documents/ASE12.ppt.pdf},\r\n ABSTRACT = {Developers may introduce anti-patterns in their software \r\n systems because of time pressure, lack of understanding, \r\n communication, and--or skills. Anti-patterns impede development and \r\n maintenance activities by making the source code more difficult to \r\n understand. Detecting anti-patterns in a whole software system may be \r\n infeasible because of the required parsing time and of the subsequent \r\n needed manual validation. Detecting anti-patterns on subsets of a \r\n system could reduce costs, effort, and resources. Researchers have \r\n proposed approaches to detect occurrences of anti-patterns but these \r\n approaches have currently some limitations: they require extensive \r\n knowledge of anti-patterns, they have limited precision and recall, \r\n and they cannot be applied on subsets of systems. To overcome these \r\n limitations, we introduce SVMDetect, a novel approach to detect \r\n anti-patterns, based on a machine learning technique---support vector \r\n machines. Indeed, through an empirical study involving three subject \r\n systems and four anti-patterns, we showed that the accuracy of \r\n SVMDetect is greater than of DETEX when detecting anti-patterns \r\n occurrences on a set of classes. Concerning, the whole system, \r\n SVMDetect is able to find more anti-patterns occurrences than DETEX.}\r\n}\r\n\r\n","author_short":["Maiga, A.","Ali, N.","Bhattacharya, N.","Saban�, A.","Gu�h�neuc, Y.","Antoniol, G.","Aimeur, E."],"editor_short":["Menzies, T.","Saeki, M."],"key":"Maiga12-ASE-FeedbackAntipatterns","id":"Maiga12-ASE-FeedbackAntipatterns","bibbaseid":"maiga-ali-bhattacharya-saban-guhneuc-antoniol-aimeur-supportvectormachinesforantipatterndetection-2012","role":"author","urls":{"Paper":"http://www.ptidej.net/publications/documents/ASE12.doc.pdf"},"keyword":["Topic: <b>Code and design smells</b>","Venue: <c>ASE</c>"],"metadata":{"authorlinks":{"gu�h�neuc, y":"https://bibbase.org/show?bib=http%3A%2F%2Fwww.yann-gael.gueheneuc.net%2FWork%2FPublications%2FBiblio%2Fcomplete-bibliography.bib&msg=embed","guéhéneuc, y":"https://bibbase.org/show?bib=http://www.yann-gael.gueheneuc.net/Work/BibBase/guehene%20(automatically%20cleaned).bib"}},"downloads":0},"search_terms":["support","vector","machines","anti","pattern","detection","maiga","ali","bhattacharya","saban�","gu�h�neuc","antoniol","aimeur"],"keywords":["topic: <b>code and design smells</b>","venue: <c>ase</c>"],"authorIDs":["AfJhKcg96muyPdu7S","xkviMnkrGBneANvMr"],"dataSources":["Sed98LbBeGaXxenrM","8vn5MSGYWB4fAx9Z4"]}