@article{ journals/tr/MalaiyaLBK02,
  added-at = {2013-01-30T00:00:00.000+0100},
  author = {Malaiya, Yashwant K. and Li, Michael Naixin and Bieman, James M. and Karcich, Rick},
  biburl = {http://www.bibsonomy.org/bibtex/2d3e1b760e52f9a48018ba0014dfaec85/dblp},
  ee = {http://dx.doi.org/10.1109/TR.2002.804489},
  interhash = {77c72129be8b2eeb5e8b8175175c2640},
  intrahash = {d3e1b760e52f9a48018ba0014dfaec85},
  journal = {IEEE Transactions on Reliability},
  keywords = {dblp},
  number = {4},
  pages = {420-426},
  title = {Software reliability growth with test coverage.},
  url = {http://dblp.uni-trier.de/db/journals/tr/tr51.html#MalaiyaLBK02},
  volume = {51},
  year = {2002}
}

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