Testing for Timing Faults in Synchronous Sequential Integrated Circuits. Malaiya, Y. K. & Narayanaswamy, R. In ITC, pages 560-573, 1983. IEEE Computer Society.
Testing for Timing Faults in Synchronous Sequential Integrated Circuits. [link]Paper  bibtex   
@inproceedings{ conf/itc/MalaiyaN83,
  added-at = {2002-11-05T00:00:00.000+0100},
  author = {Malaiya, Yashwant K. and Narayanaswamy, Ramesh},
  biburl = {http://www.bibsonomy.org/bibtex/2075512a45d32be7aea3b23239b19873a/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/1983},
  date = {2002-11-05},
  description = {dblp},
  interhash = {9ad9f4016abc0199329ca6ddc4f3b315},
  intrahash = {075512a45d32be7aea3b23239b19873a},
  keywords = {dblp},
  pages = {560-573},
  publisher = {IEEE Computer Society},
  title = {Testing for Timing Faults in Synchronous Sequential Integrated Circuits.},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc1983.html#MalaiyaN83},
  year = {1983}
}

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