Testing for Timing Faults in Synchronous Sequential Integrated Circuits. Malaiya, Y. K. & Narayanaswamy, R. In ITC, pages 560-573, 1983. IEEE Computer Society. Paper bibtex @inproceedings{ conf/itc/MalaiyaN83,
added-at = {2002-11-05T00:00:00.000+0100},
author = {Malaiya, Yashwant K. and Narayanaswamy, Ramesh},
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booktitle = {ITC},
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pages = {560-573},
publisher = {IEEE Computer Society},
title = {Testing for Timing Faults in Synchronous Sequential Integrated Circuits.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc1983.html#MalaiyaN83},
year = {1983}
}
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