@inproceedings{ conf/itc/LiawS82,
  added-at = {2010-10-20T00:00:00.000+0200},
  author = {Malaiya, Yashwant K. and Su, Stephen Y. H.},
  biburl = {http://www.bibsonomy.org/bibtex/25547ef4f9dd71f7fe7bbab42ccc80da8/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/1982},
  interhash = {eeb94876def508f8607752b54b842ee3},
  intrahash = {5547ef4f9dd71f7fe7bbab42ccc80da8},
  keywords = {dblp},
  pages = {25-34},
  publisher = {IEEE Computer Society},
  title = {A New Fault Model and Testing Technique for CMOS Devices.},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc1982.html#LiawS82},
  year = {1982}
}

{"_id":"gxf5g3ndTTmsxyZDe","bibbaseid":"malaiya-su-anewfaultmodelandtestingtechniqueforcmosdevices-1982","downloads":0,"creationDate":"2015-04-13T13:27:51.651Z","title":"A New Fault Model and Testing Technique for CMOS Devices.","author_short":["Malaiya, Y.<nbsp>K.","Su, S.<nbsp>Y.<nbsp>H."],"year":1982,"bibtype":"inproceedings","biburl":"http://www.bibsonomy.org/bib/author/yashwant?items=1000","bibdata":{"added-at":"2010-10-20T00:00:00.000+0200","author":["Malaiya, Yashwant K.","Su, Stephen Y. H."],"author_short":["Malaiya, Y.<nbsp>K.","Su, S.<nbsp>Y.<nbsp>H."],"bibtex":"@inproceedings{ conf/itc/LiawS82,\n added-at = {2010-10-20T00:00:00.000+0200},\n author = {Malaiya, Yashwant K. and Su, Stephen Y. H.},\n biburl = {http://www.bibsonomy.org/bibtex/25547ef4f9dd71f7fe7bbab42ccc80da8/dblp},\n booktitle = {ITC},\n crossref = {conf/itc/1982},\n interhash = {eeb94876def508f8607752b54b842ee3},\n intrahash = {5547ef4f9dd71f7fe7bbab42ccc80da8},\n keywords = {dblp},\n pages = {25-34},\n publisher = {IEEE Computer Society},\n title = {A New Fault Model and Testing Technique for CMOS Devices.},\n url = {http://dblp.uni-trier.de/db/conf/itc/itc1982.html#LiawS82},\n year = {1982}\n}","bibtype":"inproceedings","biburl":"http://www.bibsonomy.org/bibtex/25547ef4f9dd71f7fe7bbab42ccc80da8/dblp","booktitle":"ITC","crossref":"conf/itc/1982","id":"conf/itc/LiawS82","interhash":"eeb94876def508f8607752b54b842ee3","intrahash":"5547ef4f9dd71f7fe7bbab42ccc80da8","key":"conf/itc/LiawS82","keywords":"dblp","pages":"25-34","publisher":"IEEE Computer Society","title":"A New Fault Model and Testing Technique for CMOS Devices.","type":"inproceedings","url":"http://dblp.uni-trier.de/db/conf/itc/itc1982.html#LiawS82","year":"1982","bibbaseid":"malaiya-su-anewfaultmodelandtestingtechniqueforcmosdevices-1982","role":"author","urls":{"Paper":"http://dblp.uni-trier.de/db/conf/itc/itc1982.html#LiawS82"},"keyword":["dblp"],"downloads":0},"search_terms":["new","fault","model","testing","technique","cmos","devices","malaiya","su"],"keywords":["dblp"],"authorIDs":[],"dataSources":["HrSTN87bbtZrxhw8F"]}