Selecting best attributes for software defect prediction. Mandal, P. and Ami, A. S. In 2015 IEEE International WIE Conference on Electrical and Computer Engineering (WIECON-ECE), pages 110-113, Dec, 2015.
doi  bibtex   
@INPROCEEDINGS{7444011,
author={P. Mandal and A. S. Ami},
booktitle={2015 IEEE International WIE Conference on Electrical and Computer Engineering (WIECON-ECE)},
title={Selecting best attributes for software defect prediction},
year={2015},
pages={110-113},
keywords={Data preprocessing;NASA;Prediction algorithms;Predictive models;Software;Software algorithms;Software metrics},
doi={10.1109/WIECON-ECE.2015.7444011},
month={Dec},}
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