@article{
 title = {Cavity ringdown spectroscopy of thin films in the mid-infrared.},
 type = {article},
 year = {2002},
 identifiers = {[object Object]},
 pages = {5167-5171},
 volume = {41},
 id = {77236b85-b41c-37fc-99a7-ce4d76c61074},
 created = {2015-05-08T02:30:36.000Z},
 file_attached = {true},
 profile_id = {f8c267c4-4c39-31dc-80fa-3a9691373386},
 group_id = {63e349d6-2c70-3938-9e67-2f6483f6cbab},
 last_modified = {2015-05-08T08:00:06.000Z},
 read = {false},
 starred = {false},
 authored = {false},
 confirmed = {true},
 hidden = {false},
 abstract = {To demonstrate the potential of the cavity ringdown technique in mid-infrared spectroscopy of thin film samples, we measured absorption losses in a C60 film on a BaF2 substrate using a tunable optical parametric amplifier source. With a Brewster angle sample geometry, we achieved a fractional loss sensitivity as small as 1.3 x 10(-7) with 1.5 cm(-1) resolution, an improvement in sensitivity of 2 orders of magnitude compared to standard Fourier transform infrared methods. At an absorption sensitivity of 5 x 10(-7), spectra of several C60 overtone lines were recorded.},
 bibtype = {article},
 author = {Marcus, George A and Schwettman, H Alan},
 journal = {Applied optics},
 number = {24}
}

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