Measuring and Understanding Extreme-Scale Application Resilience: A Field Study of 5, 000, 000 HPC Application Runs. Martino, C. D.; Kramer, W.; Kalbarczyk, Z.; and Iyer, R. K. In 45th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2015, Rio de Janeiro, Brazil, June 22-25, 2015, pages 25–36, 2015.
Paper doi bibtex @inproceedings{DBLP:conf/dsn/MartinoKKI15,
author = {Catello Di Martino and
William Kramer and
Zbigniew Kalbarczyk and
Ravishankar K. Iyer},
title = {Measuring and Understanding Extreme-Scale Application Resilience:
{A} Field Study of 5, 000, 000 {HPC} Application Runs},
booktitle = {45th Annual {IEEE/IFIP} International Conference on Dependable Systems
and Networks, {DSN} 2015, Rio de Janeiro, Brazil, June 22-25, 2015},
pages = {25--36},
year = {2015},
crossref = {DBLP:conf/dsn/2015},
url = {https://doi.org/10.1109/DSN.2015.50},
doi = {10.1109/DSN.2015.50},
timestamp = {Sun, 21 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/bib/conf/dsn/MartinoKKI15},
bibsource = {dblp computer science bibliography, https://dblp.org}
}