Electromigration-aware and IR-Drop avoidance routing in analog multiport terminal structures. Martins Abreu e Silva, R., Lourenço, N. C., Canelas, A., & Horta, N. In Proceedings of Design, Automation, and Test in Europe (DATE), pages 1-6, 2014.
Electromigration-aware and IR-Drop avoidance routing in analog multiport terminal structures [link]Paper  bibtex   
@inproceedings{ dblp1866422,
  title = {Electromigration-aware and IR-Drop avoidance routing in analog multiport terminal structures},
  author = {Ricardo Martins Abreu e Silva and Nuno C. Lourenço and António Canelas and Nuno Horta},
  author_short = {Martins Abreu e Silva, R. and Lourenço, N. C. and Canelas, A. and Horta, N.},
  bibtype = {inproceedings},
  type = {inproceedings},
  year = {2014},
  key = {dblp1866422},
  id = {dblp1866422},
  biburl = {http://www.dblp.org/rec/bibtex/conf/date/SilvaLCH14},
  url = {http://dx.doi.org/10.7873/DATE.2014.023},
  conference = {DATE},
  pages = {1-6},
  text = {DATE 2014:1-6},
  booktitle = {Proceedings of Design, Automation, and Test in Europe (DATE)}
}

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