Outage Probability Analysis of PLC with Channel Gain under Nakagami-m Additive Noise. Mathur, A.; Bhatnagar, M. R.; and Panigrahi, B. K. In VTC Fall, pages 1-7, 2015. IEEE.
Outage Probability Analysis of PLC with Channel Gain under Nakagami-m Additive Noise. [link]Link  Outage Probability Analysis of PLC with Channel Gain under Nakagami-m Additive Noise. [link]Paper  bibtex   
@inproceedings{conf/vtc/MathurBP15,
  added-at = {2016-02-02T00:00:00.000+0100},
  author = {Mathur, Aashish and Bhatnagar, Manav R. and Panigrahi, Bijaya K.},
  biburl = {http://www.bibsonomy.org/bibtex/2f74cd64d6b806a915be0f9048c9c3126/dblp},
  booktitle = {VTC Fall},
  crossref = {conf/vtc/2015f},
  ee = {http://dx.doi.org/10.1109/VTCFall.2015.7391062},
  interhash = {aebc5703a0ef876659dbe979557e633d},
  intrahash = {f74cd64d6b806a915be0f9048c9c3126},
  isbn = {978-1-4799-8091-8},
  keywords = {dblp},
  pages = {1-7},
  publisher = {IEEE},
  timestamp = {2016-02-03T11:42:23.000+0100},
  title = {Outage Probability Analysis of PLC with Channel Gain under Nakagami-m Additive Noise.},
  url = {http://dblp.uni-trier.de/db/conf/vtc/vtc2015f.html#MathurBP15},
  year = 2015
}
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