Microscale temperature sensing using novel reliable silicon vertical microprobe array: Computation and experiment. Matin, M. A.; Ikedo, A.; Kawano, T.; Sawada, K.; and Ishida, M. Microelectronics Reliability, 55(12):2689-2697, 2015.
Link
Paper bibtex @article{journals/mr/MatinIKSI15,
added-at = {2016-01-06T00:00:00.000+0100},
author = {Matin, M. A. and Ikedo, A. and Kawano, T. and Sawada, K. and Ishida, Makoto},
biburl = {http://www.bibsonomy.org/bibtex/2a8dea7b136d40fc9e565c205cac8d1cb/dblp},
ee = {http://dx.doi.org/10.1016/j.microrel.2015.09.003},
interhash = {787cdeb85079a2e87e5b3179238618fa},
intrahash = {a8dea7b136d40fc9e565c205cac8d1cb},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = 12,
pages = {2689-2697},
timestamp = {2016-01-07T11:37:26.000+0100},
title = {Microscale temperature sensing using novel reliable silicon vertical microprobe array: Computation and experiment.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#MatinIKSI15},
volume = 55,
year = 2015
}