@article{matteucci_interference_1979,
	title = {Interference electron microscopy in thin film investigations},
	volume = {62},
	issn = {0040-6090},
	url = {http://www.sciencedirect.com/science/article/pii/0040609079903754},
	doi = {10.1016/0040-6090(79)90375-4},
	abstract = {An electron interferometer or an interference electron microscope may be easily constructed from a standard electron microscope by inserting an electrostatic biprism of the Möllenstedt-Düker type. The effect of the biprism on the electron image is briefly analysed in this article using the geometric optical approximation. Different electron optical set-ups are discussed and are illustrated by three examples relative to: thickness measurements of silver nuclei; an in-focus analysis of the magnetic domain wall; and an in-focus detection of the microelectric field associated with reverse-biased p-n junctions. The possibilities of applying this method to the study of electron optical phase objects are discussed.},
	number = {1},
	urldate = {2016-02-17},
	journal = {Thin Solid Films},
	author = {Matteucci, G. and Missiroli, G. F. and Pozzi, G. and Merli, P. G. and Vecchi, I.},
	month = sep,
	year = {1979},
	pages = {5--17},
}

{"_id":"dphKbtbsdSvajDzbj","bibbaseid":"matteucci-missiroli-pozzi-merli-vecchi-interferenceelectronmicroscopyinthinfilminvestigations-1979","author_short":["Matteucci, G.","Missiroli, G. F.","Pozzi, G.","Merli, P. G.","Vecchi, I."],"bibdata":{"bibtype":"article","type":"article","title":"Interference electron microscopy in thin film investigations","volume":"62","issn":"0040-6090","url":"http://www.sciencedirect.com/science/article/pii/0040609079903754","doi":"10.1016/0040-6090(79)90375-4","abstract":"An electron interferometer or an interference electron microscope may be easily constructed from a standard electron microscope by inserting an electrostatic biprism of the Möllenstedt-Düker type. The effect of the biprism on the electron image is briefly analysed in this article using the geometric optical approximation. Different electron optical set-ups are discussed and are illustrated by three examples relative to: thickness measurements of silver nuclei; an in-focus analysis of the magnetic domain wall; and an in-focus detection of the microelectric field associated with reverse-biased p-n junctions. The possibilities of applying this method to the study of electron optical phase objects are discussed.","number":"1","urldate":"2016-02-17","journal":"Thin Solid Films","author":[{"propositions":[],"lastnames":["Matteucci"],"firstnames":["G."],"suffixes":[]},{"propositions":[],"lastnames":["Missiroli"],"firstnames":["G.","F."],"suffixes":[]},{"propositions":[],"lastnames":["Pozzi"],"firstnames":["G."],"suffixes":[]},{"propositions":[],"lastnames":["Merli"],"firstnames":["P.","G."],"suffixes":[]},{"propositions":[],"lastnames":["Vecchi"],"firstnames":["I."],"suffixes":[]}],"month":"September","year":"1979","pages":"5–17","bibtex":"@article{matteucci_interference_1979,\n\ttitle = {Interference electron microscopy in thin film investigations},\n\tvolume = {62},\n\tissn = {0040-6090},\n\turl = {http://www.sciencedirect.com/science/article/pii/0040609079903754},\n\tdoi = {10.1016/0040-6090(79)90375-4},\n\tabstract = {An electron interferometer or an interference electron microscope may be easily constructed from a standard electron microscope by inserting an electrostatic biprism of the Möllenstedt-Düker type. The effect of the biprism on the electron image is briefly analysed in this article using the geometric optical approximation. Different electron optical set-ups are discussed and are illustrated by three examples relative to: thickness measurements of silver nuclei; an in-focus analysis of the magnetic domain wall; and an in-focus detection of the microelectric field associated with reverse-biased p-n junctions. The possibilities of applying this method to the study of electron optical phase objects are discussed.},\n\tnumber = {1},\n\turldate = {2016-02-17},\n\tjournal = {Thin Solid Films},\n\tauthor = {Matteucci, G. and Missiroli, G. F. and Pozzi, G. and Merli, P. G. and Vecchi, I.},\n\tmonth = sep,\n\tyear = {1979},\n\tpages = {5--17},\n}\n\n","author_short":["Matteucci, G.","Missiroli, G. F.","Pozzi, G.","Merli, P. G.","Vecchi, I."],"key":"matteucci_interference_1979","id":"matteucci_interference_1979","bibbaseid":"matteucci-missiroli-pozzi-merli-vecchi-interferenceelectronmicroscopyinthinfilminvestigations-1979","role":"author","urls":{"Paper":"http://www.sciencedirect.com/science/article/pii/0040609079903754"},"metadata":{"authorlinks":{}},"html":""},"bibtype":"article","biburl":"https://bibbase.org/zotero/spintextures","dataSources":["rXHvWQJHcL8ctHS4s"],"keywords":[],"search_terms":["interference","electron","microscopy","thin","film","investigations","matteucci","missiroli","pozzi","merli","vecchi"],"title":"Interference electron microscopy in thin film investigations","year":1979}